Although, in many cases, light optical microscopy (LOM) and scanning electron microscopy (SEM) give accurate results of metallographic examination [7,13–15], electron back-scattered diffraction (EBSD) [16,17], transmission electron microscopy (TEM) [1,18], and X-ray diffraction (XRD) [19–21] seem to be much more powerful tools for evaluating microstructure development owing to plastic deformation or heat treatment.