FIG. 8.(a) Conductive atomic force microscopy morphology and (b) current map collected on the surface of a 3C-SiC on Si sample by applying a positive bias (Vtip ¼0:5 V) to the Pt tip. The presence of the APB is clearly visible as dark con- trast in the morphology map in (a) due the surface dip related to its presence; while both the APB and the associated SFs affect the local conductance as indicated by thebrightcontrastin theimage(b).