The degradation rate [% h−1] of peak power density was calculated based on the cell test time (Table 1); values range from 4.2–14% h−1 for free-standing Pt/YSZ/Pt on Si3–5, 1.0–7.5% h−1 for Pt/YSZ/Pt on AAO10–12 and 0–0.17% h−1 for LSC/YSZ/Ni-YSZ on Ni-YSZ, Ni and LSTN-YSZ/STS substrates13,14.