Testing for jitter and its measurement is of growing importance to electronics engineers because of increased clock frequencies in digital electronic circuitry to achieve higher device performance. Higher clock frequencies have commensurately smaller eye openings, and thus impose tighter tolerances on jitter. For example, modern computer motherboards have serial bus architectures with eye openings of 160 picoseconds or less. This is extremely small compared to parallel bus architectures with equivalent performance, which may have eye openings on the order of 1000 picoseconds.