One of them is the distinction between restricted-beam techniques on the one hand (such as section topography or pinhole topography) and extended-beam techniques on the other hand, which use the full width and intensity of the incoming beam. Another, independent distinction is between integrated-wave topography, making use of the full spectrum of incoming X-ray wavelengths and divergences, and plane-wave (monochromatic) topopgraphy, more selective in both wavelengths and divergence. Integrated-wave topography can be realized as either single-crystal or double-crystal topography. Further distinctions include the one between topography in reflection geometry (Bragg-case) and in transmission geometry (Laue case).