X-ray scattering and spectroscopy techniques are also used to characterize surfaces and interfaces. While some of these measurements can be performed using laboratory X-ray sources, many require the high intensity and energy tunability of synchrotron radiation. X-ray crystal truncation rods (CTR) and X-ray standing wave (XSW) measurements probe changes in surface and adsorbate structures with sub-Ångström resolution. Surface-extended X-ray absorption fine structure (SEXAFS) measurements reveal the coordination structure and chemical state of adsorbates. Grazing-incidence small angle X-ray scattering (GISAXS) yields the size, shape, and orientation of nanoparticles on surfaces. The crystal structure and texture of thin films can be investigated using grazing-incidence X-ray diffraction (GIXD, GIXRD).