where formula_3 is the wavelength of the electron, formula_4 the Planck constant and formula_5 is integrated magnetic induction along the trajectory of the electron. This last term reduces to formula_6 when the electron beam is perpendicular to a sample of thickness formula_7 with constant in-plane magnetic induction of magnitude formula_8. The beam deflection can then be imaged on a segmented or pixelated detector. This can be used to image magnetic and electric fields in materials. While the beam deflection mechanism through the Lorentz force is the most intuitive way of understanding DPC, a quantum mechanical approach is necessary to understand the phase-shift generated by the electromagnetic fields through the Aharonov–Bohm effect.