In addition, conventional optical materials suffer a diffraction limit because only the propagating components are transmitted (by the optical material) from a light source. The non-propagating components, the evanescent waves, are not transmitted. Moreover, lenses that improve image resolution by increasing the index of refraction are limited by the availability of high-index materials, and point by point subwavelength imaging of electron microscopy also has limitations when compared to the potential of a working superlens. Scanning electron and atomic force microscopes are now used to capture detail down to a few nanometers. However, such microscopes create images by scanning objects point by point, which means they are typically limited to non-living samples, and image capture times can take up to several minutes.