Imaging most ferromagnetic materials require the current in the objective lens of the STEM to be reduced to almost zero. This is due to the sample residing inside the magnetic field of the objective lens, which can be several Tesla, which for most ferromagnetic materials would destroy any magnetic domain structure. However, turning the objective lens almost off drastically increase the amount of aberrations in the STEM probe, leading to an increase in the probe size, and reduction in resolution. By using a probe aberration corrector it is possible to get a resolution of 1 nm.