However, such experimental setup is expensive and along with a source requirement of high energy ions appears to make this technique relatively less commonly used for materials characterization, but is nevertheless commercially available. Moreover, the angle of incidence that an ion beam makes with the sample must also be taken into account for correct analysis of the sample. This is because, depending on this angle, the recoiled atoms will be collected. Although it is not very clear, the assumption for why this technique is not very well known would be due to the fact that it is hard to have a perfect combination of the source, the angle of incidence, and the detector to have the best characterization of the sample. Such problem would make the technique very time consuming and tedious.