As derived below, the electron density within the crystal and the diffraction patterns are related by a simple mathematical method, the Fourier transform, which allows the density to be calculated relatively easily from the patterns. However, this works only if the scattering is "weak", i.e., if the scattered beams are much less intense than the incoming beam. Weakly scattered beams pass through the remainder of the crystal without undergoing a second scattering event. Such re-scattered waves are called "secondary scattering" and hinder the analysis. Any sufficiently thick crystal will produce secondary scattering, but since X-rays interact relatively weakly with the electrons, this is generally not a significant concern. By contrast, electron beams may produce strong secondary scattering even for relatively thin crystals (>100 nm). Since this thickness corresponds to the diameter of many viruses, a promising direction is the electron diffraction of isolated macromolecular assemblies, such as viral capsids and molecular machines, which may be carried out with a cryo-electron microscope. Moreover, the strong interaction of electrons with matter (about 1000 times stronger than for X-rays) allows determination of the atomic structure of extremely small volumes. The field of applications for electron crystallography ranges from bio molecules like membrane proteins over organic thin films to the complex structures of (nanocrystalline) intermetallic compounds and zeolites.