An important application area for generalized transforms involves systems in which high frequency resolution is crucial. For example, darkfield electron optical transforms intermediate between direct and reciprocal space have been widely used in the harmonic analysis of atom clustering, i.e. in the study of crystals and crystal defects. Now that transmission electron microscopes are capable of providing digital images with picometer-scale information on atomic periodicity in nanostructure of all sorts, the range of pattern recognition and strain/metrology applications for intermediate transforms with high frequency resolution (like brushlets and ridgelets) is growing rapidly.