Total internal reflection microscopy (TIRM) uses the evanescent wave to illuminate small objects close to the reflecting interface. The consequent scattering of the evanescent wave (a form of frustrated TIR), makes the objects appear bright when viewed from the "external" side. In the "total internal reflection fluorescence microscope" (TIRFM), instead of relying on simple scattering, we choose an evanescent wavelength short enough to cause fluorescence (Fig.15). The high sensitivity of the illumination to the distance from the interface allows measurement of extremely small displacements and forces.