Zernike phase-contrast microscopy introduces a phase shift to the low spatial frequency components of the image with a phase-shifting annulus in the Fourier plane of the sample, so that high-spatial-frequency parts of the image can interfere with the low-frequency reference beam. In DIC the illumination is split up into two beams that are given different polarizations, are phase shifted differently, and are shifted transversely with slightly different amounts. After the specimen, the two parts are made to interfere, giving an image of the derivative of the optical path length in the direction of the difference in the transverse shift. In interferometry the illumination is split up into two beams by a partially reflective mirror. One of the beams is let through the sample before they are combined to interfere and give a direct image of the phase shifts. If the optical path length variations are more than a wavelength the image will contain fringes.