As the result of substrate effects producing preferred crystallite orientations, pronounced textures tend to occur in thin films. Modern technological devices to a large extent rely on polycrystalline thin films with thicknesses in the nanometer and micrometer ranges. This holds, for instance, for all microelectronic and most optoelectronic systems or sensoric and superconducting layers. Most thin film textures may be categorized as one of two different types: (1) for so-called fiber textures the orientation of a certain lattice plane is preferentially parallel to the substrate plane; (2) in biaxial textures the in-plane orientation of crystallites also tend to align with respect to the sample. The latter phenomenon is accordingly observed in nearly epitaxial growth processes, where certain crystallographic axes of crystals in the layer tend to align along a particular crystallographic orientation of the (single-crystal) substrate.