The degree of texture is often subjected to an evolution during thin film growth and the most pronounced textures are only obtained after the layer has achieved a certain thickness. Thin film growers thus require information about the texture profile or the texture gradient in order to optimize the deposition process. The determination of texture gradients by x-ray scattering, however, is not straightforward, because different depths of a specimen contribute to the signal. Techniques that allow for the adequate deconvolution of diffraction intensity were developed only recently.