There have been at several historical threads to electron beam microanalytical technique. One was developed by James Hillier and Richard Baker at RCA. In the early 1940s, they built an electron microprobe, combining an electron microscope and an energy loss spectrometer. A patent application was filed in 1944. Electron energy loss spectroscopy is very good for light element analysis and they obtained spectra of C-Kα, N-Kα and O-Kα radiation. In 1947, Hiller patented the idea of using an electron beam to produce analytical X-rays, but never constructed a working model. His design proposed using Bragg diffraction from a flat crystal to select specific X-ray wavelengths and a photographic plate as a detector. However, RCA had no interest in pursuing commercialization of this invention.