{TAIL ~ A system} for contactless probing of an integrated circuit chip having test points of interest for {HEAD ~ testing}, characterized by: 
{ TAIL ~ A system } for contactless probing of an integrated circuit chip having test points of interest for { HEAD ~ testing } , characterized by :
TAIL TAIL TAIL TAIL TAIL TAIL OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH HEAD HEAD HEAD HEAD HEAD OTH OTH OTH OTH