{HEAD ~ The present invention} improves {TAIL ~ the manufacturing yield} of good memory devices by providing a redundant block of memory to replace a block of memory with a defective cell 
{ HEAD ~ The present invention } improves { TAIL ~ the manufacturing yield } of good memory devices by providing a redundant block of memory to replace a block of memory with a defective cell
HEAD HEAD HEAD HEAD HEAD HEAD HEAD REL TAIL TAIL TAIL TAIL TAIL TAIL TAIL OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH