The present invention further can correct for {HEAD ~ affects} of {TAIL ~ a test fixture} in device under test measurements 
The present invention further can correct for { HEAD ~ affects } of { TAIL ~ a test fixture } in device under test measurements
OTH OTH OTH OTH OTH OTH OTH HEAD HEAD HEAD HEAD HEAD REL TAIL TAIL TAIL TAIL TAIL TAIL TAIL OTH OTH OTH OTH OTH