An apparatus and method for predicting {HEAD ~ electrical property stability} of {TAIL ~ a thin film} or conductive substrate prior to multi probe testing 
An apparatus and method for predicting { HEAD ~ electrical property stability } of { TAIL ~ a thin film } or conductive substrate prior to multi probe testing
OTH OTH OTH OTH OTH OTH HEAD HEAD HEAD HEAD HEAD HEAD HEAD REL TAIL TAIL TAIL TAIL TAIL TAIL TAIL OTH OTH OTH OTH OTH OTH OTH OTH