A system for contactless probing of an integrated circuit chip having test points of {HEAD ~ interest} for {TAIL ~ testing}, characterized by: 
A system for contactless probing of an integrated circuit chip having test points of { HEAD ~ interest } for { TAIL ~ testing } , characterized by :
OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH HEAD HEAD HEAD HEAD HEAD REL TAIL TAIL TAIL TAIL TAIL OTH OTH OTH OTH