{HEAD ~ This disclosure} relates to {TAIL ~ the analysis} of specimens with an atom probe microscope or similar analysis, such as electron tomography; in particular, it deals with the preparation of specimens and specimen holders suitable for such analysis 
{ HEAD ~ This disclosure } relates to { TAIL ~ the analysis } of specimens with an atom probe microscope or similar analysis , such as electron tomography ; in particular , it deals with the preparation of specimens and specimen holders suitable for such analysis
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