In addition, {TAIL ~ the present invention} includes a nanoindenter type device including {HEAD ~ a second probe} having the ability to measure localized electrical properties of the sample while obtaining the mechanical property measurements 
In addition , { TAIL ~ the present invention } includes a nanoindenter type device including { HEAD ~ a second probe } having the ability to measure localized electrical properties of the sample while obtaining the mechanical property measurements
OTH OTH OTH TAIL TAIL TAIL TAIL TAIL TAIL TAIL OTH OTH OTH OTH OTH OTH HEAD HEAD HEAD HEAD HEAD HEAD HEAD OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH