control means for introducing {HEAD ~ dynamic operational signals} to the chip , so as to cause {TAIL ~ instantaneous operational voltages} at selected test points as a function of operation 
control means for introducing { HEAD ~ dynamic operational signals } to the chip , so as to cause { TAIL ~ instantaneous operational voltages } at selected test points as a function of operation
OTH OTH OTH OTH HEAD HEAD HEAD HEAD HEAD HEAD HEAD OTH OTH OTH OTH OTH OTH OTH OTH TAIL TAIL TAIL TAIL TAIL TAIL TAIL OTH OTH OTH OTH OTH OTH OTH OTH OTH