{HEAD ~ A method} for measuring characteristics of {TAIL ~ a film} disposed on a substrate, said method comprising: 
{ HEAD ~ A method } for measuring characteristics of { TAIL ~ a film } disposed on a substrate , said method comprising :
HEAD HEAD HEAD HEAD HEAD HEAD OTH OTH OTH OTH TAIL TAIL TAIL TAIL TAIL TAIL OTH OTH OTH OTH OTH OTH OTH OTH OTH