{HEAD ~ Single event} upset {TAIL ~ hardening} is provided in a static random access memory cell, including cross coupled inverters, by the restoration of voltages at selected nodes within the cell by a pair of transistors connected to the cross coupling between inverters 
{ HEAD ~ Single event } upset { TAIL ~ hardening } is provided in a static random access memory cell , including cross coupled inverters , by the restoration of voltages at selected nodes within the cell by a pair of transistors connected to the cross coupling between inverters
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