Contactless probing of an integrating circuit is carried out by flooding the surface of the integrated circuit with pulsed ultraviolet laser light, causing photoelectron emission as a function of the potentials at micropoints on the integrated circuit, converting this two dimensional electron pattern into a corresponding relatively long duration pattern of {HEAD ~ luminescence} by a luminescent target, and reviewing {TAIL ~ the result} by video/computer scanning 
Contactless probing of an integrating circuit is carried out by flooding the surface of the integrated circuit with pulsed ultraviolet laser light , causing photoelectron emission as a function of the potentials at micropoints on the integrated circuit , converting this two dimensional electron pattern into a corresponding relatively long duration pattern of { HEAD ~ luminescence } by a luminescent target , and reviewing { TAIL ~ the result } by video / computer scanning
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