The present invention improves {TAIL ~ the manufacturing yield} of good memory devices by providing a redundant block of {HEAD ~ memory} to replace a block of memory with a defective cell 
The present invention improves { TAIL ~ the manufacturing yield } of good memory devices by providing a redundant block of { HEAD ~ memory } to replace a block of memory with a defective cell
OTH OTH OTH OTH TAIL TAIL TAIL TAIL TAIL TAIL TAIL OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH HEAD HEAD HEAD HEAD HEAD OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH