A surface preparation system wherein the beam shield can be unclamped from {TAIL ~ the sample}, lowered a discrete vertical distance, then re clamped to the sample in sequence to facilitate multiple milling cycles on sequentially lower regions of {HEAD ~ the sample} 
A surface preparation system wherein the beam shield can be unclamped from { TAIL ~ the sample } , lowered a discrete vertical distance , then re clamped to the sample in sequence to facilitate multiple milling cycles on sequentially lower regions of { HEAD ~ the sample }
OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH TAIL TAIL TAIL TAIL TAIL TAIL OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH HEAD HEAD HEAD HEAD HEAD HEAD