Yet another object of the present invention is to provide an improved go no go gauge for verifying whether a process kit part used within {TAIL ~ a plasma chamber} of {HEAD ~ a plasma processing tool} has accumulated excessive wear or deposits 
Yet another object of the present invention is to provide an improved go no go gauge for verifying whether a process kit part used within { TAIL ~ a plasma chamber } of { HEAD ~ a plasma processing tool } has accumulated excessive wear or deposits
OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH TAIL TAIL TAIL TAIL TAIL TAIL TAIL OTH HEAD HEAD HEAD HEAD HEAD HEAD HEAD HEAD OTH OTH OTH OTH OTH OTH