In addition, the present invention includes a nanoindenter type device including {HEAD ~ a second probe} having {TAIL ~ the ability} to measure localized electrical properties of the sample while obtaining the mechanical property measurements 
having
In addition , the present invention includes a nanoindenter type device including { HEAD ~ a second probe } having { TAIL ~ the ability } to measure localized electrical properties of the sample while obtaining the mechanical property measurements
OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH HEAD HEAD HEAD HEAD HEAD HEAD HEAD REL TAIL TAIL TAIL TAIL TAIL TAIL OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH