{HEAD ~ Measurement} of the mobile ion concentration in {TAIL ~ the oxide layer} of a semiconductor wafer 
{ HEAD ~ Measurement } of the mobile ion concentration in { TAIL ~ the oxide layer } of a semiconductor wafer
HEAD HEAD HEAD HEAD HEAD OTH OTH OTH OTH OTH OTH TAIL TAIL TAIL TAIL TAIL TAIL TAIL OTH OTH OTH OTH