Yet another object of the present invention is to provide an improved go no go gauge for verifying whether a process kit part used within a plasma chamber of {TAIL ~ a plasma processing tool} has accumulated {HEAD ~ excessive wear} or deposits 
Yet another object of the present invention is to provide an improved go no go gauge for verifying whether a process kit part used within a plasma chamber of { TAIL ~ a plasma processing tool } has accumulated { HEAD ~ excessive wear } or deposits
OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH TAIL TAIL TAIL TAIL TAIL TAIL TAIL TAIL OTH OTH HEAD HEAD HEAD HEAD HEAD HEAD OTH OTH