The present invention relates to scanning probe microscopy techniques using {HEAD ~ a noncontact atomic force microscope} which receives forces from a sample and produces {TAIL ~ a topographic image} of the surface of the sample and which is also capable of detecting magnetic forces from the sample by magnetic force microscopy utilizing the functions of the noncontact AFM 
produces
The present invention relates to scanning probe microscopy techniques using { HEAD ~ a noncontact atomic force microscope } which receives forces from a sample and produces { TAIL ~ a topographic image } of the surface of the sample and which is also capable of detecting magnetic forces from the sample by magnetic force microscopy utilizing the functions of the noncontact AFM
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