The present invention improves {HEAD ~ the manufacturing yield} of good memory devices by providing {TAIL ~ a redundant block} of memory to replace a block of memory with a defective cell 
by providing
The present invention improves { HEAD ~ the manufacturing yield } of good memory devices by providing { TAIL ~ a redundant block } of memory to replace a block of memory with a defective cell
OTH OTH OTH OTH HEAD HEAD HEAD HEAD HEAD HEAD HEAD OTH OTH OTH OTH REL REL TAIL TAIL TAIL TAIL TAIL TAIL TAIL OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH