The relatively thick layers 112 are composed of {HEAD ~ a relatively high index} of refraction material such as {TAIL ~ silicon}, and in the preferred embodiment are formed with a thickness of approximately 78.0 microns, with a thickness variation of 0.1 microns 
The relatively thick layers 112 are composed of { HEAD ~ a relatively high index } of refraction material such as { TAIL ~ silicon } , and in the preferred embodiment are formed with a thickness of approximately 78.0 microns , with a thickness variation of 0.1 microns
OTH OTH OTH OTH OTH OTH OTH OTH HEAD HEAD HEAD HEAD HEAD HEAD HEAD HEAD OTH OTH OTH OTH OTH TAIL TAIL TAIL TAIL TAIL OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH