The present invention is directed to providing a method and {HEAD ~ system} to measure {TAIL ~ characteristics} of a film disposed on a substrate 
to measure
The present invention is directed to providing a method and { HEAD ~ system } to measure { TAIL ~ characteristics } of a film disposed on a substrate
OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH HEAD HEAD HEAD HEAD HEAD REL REL TAIL TAIL TAIL TAIL TAIL OTH OTH OTH OTH OTH OTH OTH