System and method to predict the state of {TAIL ~ a process controller} in {HEAD ~ a semiconductor manufacturing facility} 
System and method to predict the state of { TAIL ~ a process controller } in { HEAD ~ a semiconductor manufacturing facility }
OTH OTH OTH OTH OTH OTH OTH OTH TAIL TAIL TAIL TAIL TAIL TAIL TAIL OTH HEAD HEAD HEAD HEAD HEAD HEAD HEAD HEAD