The present invention is directed to providing a method and {TAIL ~ system} to measure characteristics of a film disposed on {HEAD ~ a substrate} 
The present invention is directed to providing a method and { TAIL ~ system } to measure characteristics of a film disposed on { HEAD ~ a substrate }
OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH TAIL TAIL TAIL TAIL TAIL OTH OTH OTH OTH OTH OTH OTH OTH HEAD HEAD HEAD HEAD HEAD HEAD