{HEAD ~ The present invention} relates generally to {TAIL ~ inspection} of semiconductor devices for the purpose of identifying defects thereon 
relates generally to
{ HEAD ~ The present invention } relates generally to { TAIL ~ inspection } of semiconductor devices for the purpose of identifying defects thereon
HEAD HEAD HEAD HEAD HEAD HEAD HEAD REL REL REL TAIL TAIL TAIL TAIL TAIL OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH