A system for contactless probing of {HEAD ~ an integrated circuit chip} having test points of {TAIL ~ interest} for testing, characterized by: 
A system for contactless probing of { HEAD ~ an integrated circuit chip } having test points of { TAIL ~ interest } for testing , characterized by :
OTH OTH OTH OTH OTH OTH HEAD HEAD HEAD HEAD HEAD HEAD HEAD HEAD OTH OTH OTH OTH TAIL TAIL TAIL TAIL TAIL OTH OTH OTH OTH OTH OTH