The assembly is particularly well adapted for {TAIL ~ the evaluation} of probe measurement networks of the type used for testing {HEAD ~ planar microelectronic devices} 
The assembly is particularly well adapted for { TAIL ~ the evaluation } of probe measurement networks of the type used for testing { HEAD ~ planar microelectronic devices }
OTH OTH OTH OTH OTH OTH OTH TAIL TAIL TAIL TAIL TAIL TAIL OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH HEAD HEAD HEAD HEAD HEAD HEAD HEAD