The assembly is particularly well adapted for {HEAD ~ the evaluation} of {TAIL ~ probe measurement networks} of the type used for testing planar microelectronic devices 
of
The assembly is particularly well adapted for { HEAD ~ the evaluation } of { TAIL ~ probe measurement networks } of the type used for testing planar microelectronic devices
OTH OTH OTH OTH OTH OTH OTH HEAD HEAD HEAD HEAD HEAD HEAD REL TAIL TAIL TAIL TAIL TAIL TAIL TAIL OTH OTH OTH OTH OTH OTH OTH OTH OTH