The present invention is directed to providing a method and system to measure {TAIL ~ characteristics} of a film disposed on {HEAD ~ a substrate} 
The present invention is directed to providing a method and system to measure { TAIL ~ characteristics } of a film disposed on { HEAD ~ a substrate }
OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH TAIL TAIL TAIL TAIL TAIL OTH OTH OTH OTH OTH HEAD HEAD HEAD HEAD HEAD HEAD