The present invention is directed to providing a method and system to measure characteristics of {HEAD ~ a film} disposed on {TAIL ~ a substrate} 
disposed on
The present invention is directed to providing a method and system to measure characteristics of { HEAD ~ a film } disposed on { TAIL ~ a substrate }
OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH HEAD HEAD HEAD HEAD HEAD HEAD REL REL TAIL TAIL TAIL TAIL TAIL TAIL