The present invention improves the manufacturing yield of good memory devices by providing a redundant block of memory to replace {HEAD ~ a block} of {TAIL ~ memory} with a defective cell 
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The present invention improves the manufacturing yield of good memory devices by providing a redundant block of memory to replace { HEAD ~ a block } of { TAIL ~ memory } with a defective cell
OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH HEAD HEAD HEAD HEAD HEAD HEAD REL TAIL TAIL TAIL TAIL TAIL OTH OTH OTH OTH