Thereafter, the probe shaft can be cut off outside {HEAD ~ the perimeter} of {TAIL ~ the specimen assembly form}, and the specimen conveniently held and sharpened for atom probe analysis 
of
Thereafter , the probe shaft can be cut off outside { HEAD ~ the perimeter } of { TAIL ~ the specimen assembly form } , and the specimen conveniently held and sharpened for atom probe analysis
OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH HEAD HEAD HEAD HEAD HEAD HEAD REL TAIL TAIL TAIL TAIL TAIL TAIL TAIL TAIL OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH