Aspects of the present invention generally involve the field of post fabrication processing of integrated circuits for testing, characterization, and modification to test design alterations, and more particularly involves an apparatus and method for defining a circuit edit, probe point, or {TAIL ~ other integrated circuit operation} that may be employed by a circuit operation tool, such as {HEAD ~ a focused ion beam tool}, e beam tool, laser tool, or the like 
Aspects of the present invention generally involve the field of post fabrication processing of integrated circuits for testing , characterization , and modification to test design alterations , and more particularly involves an apparatus and method for defining a circuit edit , probe point , or { TAIL ~ other integrated circuit operation } that may be employed by a circuit operation tool , such as { HEAD ~ a focused ion beam tool } , e beam tool , laser tool , or the like
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