{HEAD ~ The present invention} achieves {TAIL ~ technical advantages} by using a nanoindenter type device to determine localized mechanical properties of a substrate as a function of displacement depth or applied load of the nanoindenter tip into the substrate surface, and accurately predicting the electrical property stability of the substrate under test as a function of this data 
achieves
{ HEAD ~ The present invention } achieves { TAIL ~ technical advantages } by using a nanoindenter type device to determine localized mechanical properties of a substrate as a function of displacement depth or applied load of the nanoindenter tip into the substrate surface , and accurately predicting the electrical property stability of the substrate under test as a function of this data
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