Contactless probing of an integrating circuit is carried out by flooding the surface of the integrated circuit with pulsed ultraviolet laser light, causing photoelectron emission as a function of the potentials at micropoints on the integrated circuit, converting this two dimensional electron pattern into a corresponding relatively long duration pattern of luminescence by a luminescent target, and reviewing {HEAD ~ the result} by {TAIL ~ video/computer} scanning 
by
Contactless probing of an integrating circuit is carried out by flooding the surface of the integrated circuit with pulsed ultraviolet laser light , causing photoelectron emission as a function of the potentials at micropoints on the integrated circuit , converting this two dimensional electron pattern into a corresponding relatively long duration pattern of luminescence by a luminescent target , and reviewing { HEAD ~ the result } by { TAIL ~ video / computer } scanning
OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH HEAD HEAD HEAD HEAD HEAD HEAD REL TAIL TAIL TAIL TAIL TAIL TAIL TAIL OTH