A system for contactless probing of an integrated circuit chip having {HEAD ~ test points} of interest for {TAIL ~ testing}, characterized by: 
A system for contactless probing of an integrated circuit chip having { HEAD ~ test points } of interest for { TAIL ~ testing } , characterized by :
OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH HEAD HEAD HEAD HEAD HEAD HEAD OTH OTH OTH TAIL TAIL TAIL TAIL TAIL OTH OTH OTH OTH