This disclosure relates to the analysis of specimens with an atom probe microscope or {TAIL ~ similar analysis}, such as electron tomography; in particular, it deals with the preparation of {HEAD ~ specimens} and specimen holders suitable for such analysis 
This disclosure relates to the analysis of specimens with an atom probe microscope or { TAIL ~ similar analysis } , such as electron tomography ; in particular , it deals with the preparation of { HEAD ~ specimens } and specimen holders suitable for such analysis
OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH TAIL TAIL TAIL TAIL TAIL TAIL OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH HEAD HEAD HEAD HEAD HEAD OTH OTH OTH OTH OTH OTH OTH