{TAIL ~ The present invention} relates generally to {HEAD ~ inspection} of semiconductor devices for the purpose of identifying defects thereon 
{ TAIL ~ The present invention } relates generally to { HEAD ~ inspection } of semiconductor devices for the purpose of identifying defects thereon
TAIL TAIL TAIL TAIL TAIL TAIL TAIL OTH OTH OTH HEAD HEAD HEAD HEAD HEAD OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH