A system for contactless probing of {HEAD ~ an integrated circuit chip} having {TAIL ~ test points} of interest for testing, characterized by: 
having
A system for contactless probing of { HEAD ~ an integrated circuit chip } having { TAIL ~ test points } of interest for testing , characterized by :
OTH OTH OTH OTH OTH OTH HEAD HEAD HEAD HEAD HEAD HEAD HEAD HEAD REL TAIL TAIL TAIL TAIL TAIL TAIL OTH OTH OTH OTH OTH OTH OTH OTH