receiving a test voltage output from a device under test , said DUT configured as a replica of a segment of the inverter circuit that is desired to be calibrated to exhibit a specific electrical characteristic and said {HEAD ~ DUT} receiving {TAIL ~ a control input} 
receiving
receiving a test voltage output from a device under test , said DUT configured as a replica of a segment of the inverter circuit that is desired to be calibrated to exhibit a specific electrical characteristic and said { HEAD ~ DUT } receiving { TAIL ~ a control input }
OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH HEAD HEAD HEAD HEAD HEAD REL TAIL TAIL TAIL TAIL TAIL TAIL TAIL