The present invention is directed to providing a method and system to measure {HEAD ~ characteristics} of {TAIL ~ a film} disposed on a substrate 
of
The present invention is directed to providing a method and system to measure { HEAD ~ characteristics } of { TAIL ~ a film } disposed on a substrate
OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH HEAD HEAD HEAD HEAD HEAD REL TAIL TAIL TAIL TAIL TAIL TAIL OTH OTH OTH OTH