receiving {TAIL ~ a test voltage output} from a device under test , said DUT configured as a replica of a segment of the inverter circuit that is desired to be calibrated to exhibit a specific electrical characteristic and said DUT receiving {HEAD ~ a control input} 
receiving { TAIL ~ a test voltage output } from a device under test , said DUT configured as a replica of a segment of the inverter circuit that is desired to be calibrated to exhibit a specific electrical characteristic and said DUT receiving { HEAD ~ a control input }
OTH TAIL TAIL TAIL TAIL TAIL TAIL TAIL TAIL OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH HEAD HEAD HEAD HEAD HEAD HEAD HEAD