A feature of the invention is the biasing of the chip to test to provide {HEAD ~ increased discrimination} by providing {TAIL ~ a threshold} for laser induced photoemission 
by providing
A feature of the invention is the biasing of the chip to test to provide { HEAD ~ increased discrimination } by providing { TAIL ~ a threshold } for laser induced photoemission
OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH HEAD HEAD HEAD HEAD HEAD HEAD REL REL TAIL TAIL TAIL TAIL TAIL TAIL OTH OTH OTH OTH