Furthermore, the present inventor et al have also found a problem that if {HEAD ~ a high frequency wiring} is provided for an inductor, transformer, or the like, the parasitic capacity components of the inductor and the transformer increase due to {TAIL ~ not only the existence} of the dummy metals just under the high frequency wiring, but also the existence of its surrounding dummy metals 
Furthermore , the present inventor et al have also found a problem that if { HEAD ~ a high frequency wiring } is provided for an inductor , transformer , or the like , the parasitic capacity components of the inductor and the transformer increase due to { TAIL ~ not only the existence } of the dummy metals just under the high frequency wiring , but also the existence of its surrounding dummy metals
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