A surface preparation system wherein the beam shield can be unclamped from the sample, lowered a discrete vertical distance, then re clamped to the sample in sequence to facilitate multiple milling cycles on {TAIL ~ sequentially lower regions} of {HEAD ~ the sample} 
A surface preparation system wherein the beam shield can be unclamped from the sample , lowered a discrete vertical distance , then re clamped to the sample in sequence to facilitate multiple milling cycles on { TAIL ~ sequentially lower regions } of { HEAD ~ the sample }
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