{HEAD ~ The relatively thick layers} 112 are composed of {TAIL ~ a relatively high index} of refraction material such as silicon, and in the preferred embodiment are formed with a thickness of approximately 78.0 microns, with a thickness variation of 0.1 microns 
are composed of
{ HEAD ~ The relatively thick layers } 112 are composed of { TAIL ~ a relatively high index } of refraction material such as silicon , and in the preferred embodiment are formed with a thickness of approximately 78.0 microns , with a thickness variation of 0.1 microns
HEAD HEAD HEAD HEAD HEAD HEAD HEAD HEAD OTH REL REL REL TAIL TAIL TAIL TAIL TAIL TAIL TAIL TAIL OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH