Thus, it is possible to detect {HEAD ~ the inclination angle} of the surface to be measured on {TAIL ~ the basis} of the capacitances 
to be measured on
Thus , it is possible to detect { HEAD ~ the inclination angle } of the surface to be measured on { TAIL ~ the basis } of the capacitances
OTH OTH OTH OTH OTH OTH OTH HEAD HEAD HEAD HEAD HEAD HEAD HEAD OTH OTH OTH REL REL REL REL TAIL TAIL TAIL TAIL TAIL TAIL OTH OTH OTH