The present invention improves the manufacturing yield of good memory devices by providing a redundant block of memory to replace a block of {HEAD ~ memory} with {TAIL ~ a defective cell} 
with
The present invention improves the manufacturing yield of good memory devices by providing a redundant block of memory to replace a block of { HEAD ~ memory } with { TAIL ~ a defective cell }
OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH HEAD HEAD HEAD HEAD HEAD REL TAIL TAIL TAIL TAIL TAIL TAIL TAIL