The present invention relates generally to {HEAD ~ inspection} of {TAIL ~ semiconductor devices} for the purpose of identifying defects thereon 
of
The present invention relates generally to { HEAD ~ inspection } of { TAIL ~ semiconductor devices } for the purpose of identifying defects thereon
OTH OTH OTH OTH OTH OTH HEAD HEAD HEAD HEAD HEAD REL TAIL TAIL TAIL TAIL TAIL TAIL OTH OTH OTH OTH OTH OTH OTH