In addition, {HEAD ~ the present invention} includes {TAIL ~ a nanoindenter type device} including a second probe having the ability to measure localized electrical properties of the sample while obtaining the mechanical property measurements 
includes
In addition , { HEAD ~ the present invention } includes { TAIL ~ a nanoindenter type device } including a second probe having the ability to measure localized electrical properties of the sample while obtaining the mechanical property measurements
OTH OTH OTH HEAD HEAD HEAD HEAD HEAD HEAD HEAD REL TAIL TAIL TAIL TAIL TAIL TAIL TAIL TAIL OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH