{HEAD ~ An IC socket} mounted on {TAIL ~ a test board} while in use and having a semiconductor device with projection electrodes mounted on said IC socket for testing, comprising: 
mounted on
{ HEAD ~ An IC socket } mounted on { TAIL ~ a test board } while in use and having a semiconductor device with projection electrodes mounted on said IC socket for testing , comprising :
HEAD HEAD HEAD HEAD HEAD HEAD HEAD REL REL TAIL TAIL TAIL TAIL TAIL TAIL TAIL OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH