receiving a test voltage output from a device under test , said {TAIL ~ DUT} configured as a replica of a segment of the inverter circuit that is desired to be calibrated to exhibit a specific electrical characteristic and said {HEAD ~ DUT} receiving a control input 
receiving a test voltage output from a device under test , said { TAIL ~ DUT } configured as a replica of a segment of the inverter circuit that is desired to be calibrated to exhibit a specific electrical characteristic and said { HEAD ~ DUT } receiving a control input
OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH TAIL TAIL TAIL TAIL TAIL OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH HEAD HEAD HEAD HEAD HEAD OTH OTH OTH OTH