This additional electrical measurement is correlated with {TAIL ~ the mechanical property measurements} to accurately predict electrical property stability of the entire conductive substrate, preferably by predicting {HEAD ~ the presence} of an unwanted material surface layer 
This additional electrical measurement is correlated with { TAIL ~ the mechanical property measurements } to accurately predict electrical property stability of the entire conductive substrate , preferably by predicting { HEAD ~ the presence } of an unwanted material surface layer
OTH OTH OTH OTH OTH OTH OTH TAIL TAIL TAIL TAIL TAIL TAIL TAIL TAIL OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH HEAD HEAD HEAD HEAD HEAD HEAD OTH OTH OTH OTH OTH OTH