{HEAD ~ The present invention} further can correct for {TAIL ~ affects} of a test fixture in device under test measurements 
correct for
{ HEAD ~ The present invention } further can correct for { TAIL ~ affects } of a test fixture in device under test measurements
HEAD HEAD HEAD HEAD HEAD HEAD HEAD OTH OTH REL REL TAIL TAIL TAIL TAIL TAIL OTH OTH OTH OTH OTH OTH OTH OTH OTH