{HEAD ~ An insulating layer}, in embodiments, may reduce {TAIL ~ a channel size} and may substantially prevent leakage current, which may allow for the size of a semiconductor device to be reduced 
reduce
{ HEAD ~ An insulating layer } , in embodiments , may reduce { TAIL ~ a channel size } and may substantially prevent leakage current , which may allow for the size of a semiconductor device to be reduced
HEAD HEAD HEAD HEAD HEAD HEAD HEAD OTH OTH OTH OTH OTH REL TAIL TAIL TAIL TAIL TAIL TAIL TAIL OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH