This disclosure relates to the analysis of specimens with an atom probe microscope or similar analysis, such as electron tomography; in particular, it deals with the preparation of specimens and {HEAD ~ specimen holders} suitable for {TAIL ~ such analysis} 
suitable for
This disclosure relates to the analysis of specimens with an atom probe microscope or similar analysis , such as electron tomography ; in particular , it deals with the preparation of specimens and { HEAD ~ specimen holders } suitable for { TAIL ~ such analysis }
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