{HEAD ~ A method} for measuring characteristics of a film disposed on {TAIL ~ a substrate}, said method comprising: 
{ HEAD ~ A method } for measuring characteristics of a film disposed on { TAIL ~ a substrate } , said method comprising :
HEAD HEAD HEAD HEAD HEAD HEAD OTH OTH OTH OTH OTH OTH OTH OTH TAIL TAIL TAIL TAIL TAIL TAIL OTH OTH OTH OTH OTH