This disclosure relates to {HEAD ~ the analysis} of specimens with {TAIL ~ an atom probe microscope} or similar analysis, such as electron tomography; in particular, it deals with the preparation of specimens and specimen holders suitable for such analysis 
with
This disclosure relates to { HEAD ~ the analysis } of specimens with { TAIL ~ an atom probe microscope } or similar analysis , such as electron tomography ; in particular , it deals with the preparation of specimens and specimen holders suitable for such analysis
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