The present invention relates in general to {HEAD ~ quality control inspection systems}, and a particular to {TAIL ~ a vision system} for providing three dimensional inspection of electronic components 
The present invention relates in general to { HEAD ~ quality control inspection systems } , and a particular to { TAIL ~ a vision system } for providing three dimensional inspection of electronic components
OTH OTH OTH OTH OTH OTH OTH HEAD HEAD HEAD HEAD HEAD HEAD HEAD HEAD OTH OTH OTH OTH OTH TAIL TAIL TAIL TAIL TAIL TAIL TAIL OTH OTH OTH OTH OTH OTH OTH OTH