In addition, the present invention includes a nanoindenter type device including a second probe having {HEAD ~ the ability} to measure {TAIL ~ localized electrical properties} of the sample while obtaining the mechanical property measurements 
to measure
In addition , the present invention includes a nanoindenter type device including a second probe having { HEAD ~ the ability } to measure { TAIL ~ localized electrical properties } of the sample while obtaining the mechanical property measurements
OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH HEAD HEAD HEAD HEAD HEAD HEAD REL REL TAIL TAIL TAIL TAIL TAIL TAIL TAIL OTH OTH OTH OTH OTH OTH OTH OTH OTH