The present invention improves the manufacturing yield of good memory devices by providing {HEAD ~ a redundant block} of memory to replace {TAIL ~ a block} of memory with a defective cell 
to replace
The present invention improves the manufacturing yield of good memory devices by providing { HEAD ~ a redundant block } of memory to replace { TAIL ~ a block } of memory with a defective cell
OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH HEAD HEAD HEAD HEAD HEAD HEAD HEAD OTH OTH REL REL TAIL TAIL TAIL TAIL TAIL TAIL OTH OTH OTH OTH OTH OTH