Thereafter, the probe shaft can be cut off outside {TAIL ~ the perimeter} of the specimen assembly form, and {HEAD ~ the specimen} conveniently held and sharpened for atom probe analysis 
Thereafter , the probe shaft can be cut off outside { TAIL ~ the perimeter } of the specimen assembly form , and { HEAD ~ the specimen } conveniently held and sharpened for atom probe analysis
OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH TAIL TAIL TAIL TAIL TAIL TAIL OTH OTH OTH OTH OTH OTH OTH HEAD HEAD HEAD HEAD HEAD HEAD OTH OTH OTH OTH OTH OTH OTH OTH