receiving {HEAD ~ a test voltage output} from {TAIL ~ a device} under test , said DUT configured as a replica of a segment of the inverter circuit that is desired to be calibrated to exhibit a specific electrical characteristic and said DUT receiving a control input 
from
receiving { HEAD ~ a test voltage output } from { TAIL ~ a device } under test , said DUT configured as a replica of a segment of the inverter circuit that is desired to be calibrated to exhibit a specific electrical characteristic and said DUT receiving a control input
OTH HEAD HEAD HEAD HEAD HEAD HEAD HEAD HEAD REL TAIL TAIL TAIL TAIL TAIL TAIL OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH