Additionally, it relates to X ray emission analysis techniques for identifying and spatially locating {HEAD ~ defects} found in or on {TAIL ~ integrated circuit devices} 
found in
Additionally , it relates to X ray emission analysis techniques for identifying and spatially locating { HEAD ~ defects } found in or on { TAIL ~ integrated circuit devices }
OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH HEAD HEAD HEAD HEAD HEAD REL REL OTH OTH TAIL TAIL TAIL TAIL TAIL TAIL TAIL