With laser pulse widths of 5 picosends or less, time resolution of the full chip testing system remains extremely fast, consistent with both AC waveform and real time {HEAD ~ logic state testing} of {TAIL ~ high performance integrated circuits} 
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With laser pulse widths of 5 picosends or less , time resolution of the full chip testing system remains extremely fast , consistent with both AC waveform and real time { HEAD ~ logic state testing } of { TAIL ~ high performance integrated circuits }
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