The present invention improves the manufacturing yield of good memory devices by providing {TAIL ~ a redundant block} of {HEAD ~ memory} to replace a block of memory with a defective cell 
The present invention improves the manufacturing yield of good memory devices by providing { TAIL ~ a redundant block } of { HEAD ~ memory } to replace a block of memory with a defective cell
OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH TAIL TAIL TAIL TAIL TAIL TAIL TAIL OTH HEAD HEAD HEAD HEAD HEAD OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH