A system for {HEAD ~ contactless probing} of {TAIL ~ an integrated circuit chip} having test points of interest for testing, characterized by: 
A system for { HEAD ~ contactless probing } of { TAIL ~ an integrated circuit chip } having test points of interest for testing , characterized by :
OTH OTH OTH HEAD HEAD HEAD HEAD HEAD HEAD REL TAIL TAIL TAIL TAIL TAIL TAIL TAIL TAIL OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH