The present invention further can correct for affects of {HEAD ~ a test fixture} in {TAIL ~ device} under test measurements 
The present invention further can correct for affects of { HEAD ~ a test fixture } in { TAIL ~ device } under test measurements
OTH OTH OTH OTH OTH OTH OTH OTH OTH HEAD HEAD HEAD HEAD HEAD HEAD HEAD REL TAIL TAIL TAIL TAIL TAIL OTH OTH OTH