The present invention further can correct for affects of a test fixture in {HEAD ~ device} under {TAIL ~ test measurements} 
The present invention further can correct for affects of a test fixture in { HEAD ~ device } under { TAIL ~ test measurements }
OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH HEAD HEAD HEAD HEAD HEAD REL TAIL TAIL TAIL TAIL TAIL TAIL