In addition, the present invention includes {TAIL ~ a nanoindenter type device} including a second probe having the ability to measure localized electrical properties of {HEAD ~ the sample} while obtaining the mechanical property measurements 
In addition , the present invention includes { TAIL ~ a nanoindenter type device } including a second probe having the ability to measure localized electrical properties of { HEAD ~ the sample } while obtaining the mechanical property measurements
OTH OTH OTH OTH OTH OTH OTH TAIL TAIL TAIL TAIL TAIL TAIL TAIL TAIL OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH HEAD HEAD HEAD HEAD HEAD HEAD OTH OTH OTH OTH OTH OTH