The present invention improves the manufacturing yield of {TAIL ~ good memory devices} by providing a redundant block of memory to replace a block of {HEAD ~ memory} with a defective cell 
The present invention improves the manufacturing yield of { TAIL ~ good memory devices } by providing a redundant block of memory to replace a block of { HEAD ~ memory } with a defective cell
OTH OTH OTH OTH OTH OTH OTH OTH TAIL TAIL TAIL TAIL TAIL TAIL TAIL OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH HEAD HEAD HEAD HEAD HEAD OTH OTH OTH OTH