Aspects of the present invention generally involve the field of post fabrication processing of integrated circuits for testing, characterization, and modification to test design alterations, and more particularly involves {HEAD ~ an apparatus} and method for defining a circuit edit, {TAIL ~ probe point}, or other integrated circuit operation that may be employed by a circuit operation tool, such as a focused ion beam tool, e beam tool, laser tool, or the like 
Aspects of the present invention generally involve the field of post fabrication processing of integrated circuits for testing , characterization , and modification to test design alterations , and more particularly involves { HEAD ~ an apparatus } and method for defining a circuit edit , { TAIL ~ probe point } , or other integrated circuit operation that may be employed by a circuit operation tool , such as a focused ion beam tool , e beam tool , laser tool , or the like
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