receiving a test voltage output from a device under test , said {HEAD ~ DUT} configured as {TAIL ~ a replica} of a segment of the inverter circuit that is desired to be calibrated to exhibit a specific electrical characteristic and said DUT receiving a control input 
receiving a test voltage output from a device under test , said { HEAD ~ DUT } configured as { TAIL ~ a replica } of a segment of the inverter circuit that is desired to be calibrated to exhibit a specific electrical characteristic and said DUT receiving a control input
OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH HEAD HEAD HEAD HEAD HEAD REL REL TAIL TAIL TAIL TAIL TAIL TAIL OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH OTH