A charged device model (CDM) test is used to define the ESD a device can withstand when the device itself has an electrostatic charge and discharges due to metal contact. This discharge type is the most common type of ESD in electronic devices and causes most of the ESD damages in their manufacturing. CDM discharge depends mainly on parasitic parameters of the discharge and strongly depends on size and type of component package.
Daft Punk feat. Pharrell Williams - Get Lucky. First the helmet was a gimmick and now the creator is selling them on etsy for 500 bucks a pop. That is when you know you have a catchy product and a great EDM band to push it for you. Now the helmets are back and they are headlining with a new song called Get Lucky featuring the one and only Pharrell Williams who is a musical genius in his own right. The new album Random Access Memories is in stores today on 5/21/2013.
replay this video. Buy Now Embed britt-nicole 66660 views 2010-10-02T01:46:03 Official music video for the song The Lost Get Found by Britt Nicole. Buy the song here! http://itunes.apple.com/us/album/the-lost-get-found/id324585350.