{"push_id":2476674195,"size":2,"distinct_size":2,"ref":"refs/heads/master","head":"def16732acff73e0e88717cce0408b650f066648","before":"c69dc65c830983a8159b80594618f922ab0a121c","commits":[{"sha":"f44cf01cae10c3834a49ce827ceca816650d2ea1","author":{"name":"John Griffiths","email":"6cc84882a8a130d8c294e2dee99a3c534d4157dd@gmail.com"},"message":"added s1pnvf521ao.md","distinct":true,"url":"https://api.github.com/repos/JohnGriffiths/Estimating-conduction-delays-from-tractography-and-microstructure-imaging-an-uncertainty-propagation/commits/f44cf01cae10c3834a49ce827ceca816650d2ea1"},{"sha":"def16732acff73e0e88717cce0408b650f066648","author":{"name":"John Griffiths","email":"6cc84882a8a130d8c294e2dee99a3c534d4157dd@gmail.com"},"message":"updated layout","distinct":true,"url":"https://api.github.com/repos/JohnGriffiths/Estimating-conduction-delays-from-tractography-and-microstructure-imaging-an-uncertainty-propagation/commits/def16732acff73e0e88717cce0408b650f066648"}]}
{"actor":{"display_login":"JohnGriffiths"}}