recently[@Wang2016]. Since numerous ferroelectric relaxors exist, numerically treating each of them remains a daunting task. One way to mitigate this difficulty is to resort to statistical modeling [@Sethna2010]. For a complex system, a statistical approach can provide intuitive understanding by capturing dominant factors, provide equations to understand experimental results. and help extracting useful information. In the present work, we adopt this approach to treat the dielectric response of relaxors and show that such a statistical model can indeed be applied to understanding how the dielectric constants change with temperatures and probing frequency.

While the susceptibility of relaxors, $\chi\left(T,\nu\right)$, depends on both temperature and frequency, theoretical models are often proposed to treat $\nu$ and $T$ separately [@Uchino2014; @Bokov2012; @Cross1987a; @UniversalRelaxation; @DielRelaxSolids; @Nuzhnyy2012]. For instance, at a given temperature, two processes are employed in the fitting of $\chi\left(\nu\right)$ of Ba (Ti$_{0.675}$Zr$_{0.325}$ )O$_{3}$: the universal relaxor process and the conventional relaxor process, which have different relaxation characteristics employing the Curie-Von Schweidler law at low frequency and the Kohlrausch-Williams-Watts law at higher frequency [@Bokov2007BZT]. Other formula, such as the Cole-Cole and the Havriliak-Negami equations, are also employed to model the dielectric response with respect to frequency at given temperatures. When phonon modes are close 