limited by the length of the transport channel rather than by the acoustic transport efficiency (see Sec. \[Acoustic\_exciton\_transport\]). In fact, IX lifetime can be increased by at least another order of magnitude, thus allowing much longer transport lengths with minimal signal loss and distortion, which is essential for the scalability of exciton-based circuitry.

A further interesting feature of the SAW-induced transport is that the IXs remain trapped within the 50 $\mu$m-wide beams (outlined by vertical dotted rectangle in Fig. \[Fig3\](a)). The fabrication of the transport channels does not require lateral electrode structuring or the introduction of lateral interfaces, which can deteriorate the material’s properties. Moreover the EXAM concept is extensive to other systems and can be applied to interconnect an arbitrary number N of remote communication ports. In particular, that the maximum required acoustic transport length (and IX lifetime) does not limit the scalability since it increases only with $\sqrt{N}$. Also, by decreasing the overlap length of the IDT fingers, the width of the SAW beams, and hence of the transport channels, can be further reduced. For a given length, the minimum channel width will be ultimately determined by SAW diffraction. The latter can be minimized by reducing ${\lambda_\mathrm{SAW}}$ or 