always perpendicular in the measurement. The extra factor $\phi_{0}$ is taken to incorporate the misalignment of sample positioning in defining the $\phi$ value during the measurement. The detailed fits with and without incorporation of small offset in $\phi$ value is shown in Fig. A2 in the supplementary information. Further the AMR contribution also can be quantified by the following formula \[36\] :

$$\label{q10}
  V_{AMR}=\sqrt{(V_{Asym}^{AMR \perp,||})^{2}+(V_{sym}^{AMR \perp,||})^{2}}$$

The *$V_{Asym}^{AMR \perp,||}$* and *$V_{sym}^{AMR \perp,||}$* are evaluated from the in-plane angle dependent *$V_{meas}$* measurements by fitting those values by equations \[q8\] and \[q9\], respectively. The extracted values of the various components are listed in the Table II.

It is observed that the *$V_{sp}$* is dominating over other unwanted spin rectification effects in all the samples. However, the magnitude of AHE is comparable to the spin pumping, which is decreased by one order for thicker Pt samples. It may be due to increase in conductivity of Pt layer due to increase in its thickness. It is well known that the AHE majorly depend on the magnetization of the sample due to berry curvature of the FM \[39\]. The AHE contribution is an intrinsic property of the FM layer. The Co based FM materials are 