Many methods to design the frozen sets on-the-fly with limited complexity have been proposed [@comp_AWGN]. Along with Bhattacharyya parameter tracking, Ar[i]{}kan initially proposed to use Monte-Carlo simulations to estimate bit-channel reliabilities [@arikan]. The density evolution (DE) method, initially proposed in [@DE_mori] and improved in [@tal], can provide theoretical guarantees on the estimation accuracy, however at a high computational cost. A bit-channel reliability estimation method for AWGN channels based on Gaussian approximation (GA) of density evolution, termed as DE/GA method, has been proposed in [@trip_design], giving accurate results with limited complexity. However, on-the-fly design increases coding latency too much to meet the 5G requirements.

Recent studies on the partial reliability order imposed by the polarization effect on bit-channels [@part_ord; @beta_exp; @partHW] opened new opportunities in the generation of an universal reliability sequence to be used independently on channel conditions. These studies and intensive simulations lead the 5G standardization to propose a unique universal bit-channel reliability sequence to be used as a basis to extract the individual reliability sequence for each polar code considered in 5G. This sequence, composed by 1024 bit-channel indices sorted in reliability order, can be used regardless the channel conditions to design the frozen set of any polar 