value $\Delta_{2\theta}$ ($\Delta_{2\theta}$ = $2\theta_\textup{LCO}$ - $2\theta_\textup{LAO}$) between LCO and LAO (004)-reflection peak is -0.868 degree, while for LSAT and STO substrates, the $\Delta_{2\theta}$ value are -0.344 and +0.526 degree, respectively. The film thickness was determined by fitting the x-ray reflectivity (XRR) spectra. For instance, we plot XRR spectrum of Pt(5.2 nm)/LCO(53.9 nm)/STO hybrid in Fig. 1(d). It is noted that the actual Pt thicknesses derived from the simulations of XRR spectra are almost identical to the nominal thicknesses. For clarity, the nominal Pt thicknesses rather than actual thicknesses are used in this paper. The epitaxial nature of LCO films was characterized by $\varphi$-scan measurement with a fixed 2$\theta$ value at the (011) reflection of substrate and LCO film. For instance, the $\varphi$-scans of Pt/LCO/STO hybrid are plotted in the inset of Fig. 1(d), with the other hybrids showing similar patterns. The atomic force microscope surface topographies of Pt/LCO/LAO (PLL), Pt/LCO/LSAT (PLLA), and Pt/LCO/STO (PLS) hybrids reveal the surface roughness ranging from 0.2 nm to 0.6 nm, indicating atomical flat of prepared films. Figure 1(e) plot a representative three dimensional AFM topography of PLS hybrid.

![(Color online) Temperature dependence of the electrical resistivity of LCO films. The thickness of LCO 