Department of Statistics and Data Science, Yale University, New Haven, CT 06511 USA; Department of Statistics, University of Chicago, Chicago, IL 60637 USA; Department of Mathematics, Hong Kong University of Science and Technology, Kowloon, Hong Kong
Chao Gao, Jiyi Liu, Yuan Yao, Weizhi ZHU
robust statistics;neural networks;minimax rate;data depth;contamination model;Tukey median;GAN
ROBUST ESTIMATION VIA GENERATIVE ADVERSARIAL NETWORKS