Samsung SDS, South Korea; University of British Columbia, Canada; University of Birmingham, United Kingdom; Chung-Ang University, South Korea
Jongwon Choi, Kwang Moo Yi, Jihoon Kim, Jinho Choo, Byoungjip Kim, Jinyeop Chang, Youngjune Gwon, Hyung Jin Chang
VaB-AL: Incorporating Class Imbalance and Difficulty With Variational Bayes for Active Learning