University of Cambridge, UK; Department of Electrical and Computer Engineering, UCLA, California, USA; Alan Turing Institute, London, UK; Department of Electrical and Computer Engineering, UCLA, California, USA; Engineering Science Department, University of Oxford, UK
James Jordon, Jinsung Yoon, Mihaela Schaar
Knockoff model;Feature selection;False discovery rate control;Generative Adversarial networks
KnockoffGAN: Generating Knockoffs for Feature Selection using Generative Adversarial Networks