Consultant, Washington, DC, U.S.A.; National Institute of Standards and Technology (NIST), Gaithersburg, MD, U.S.A.; Michigan State University, East Lansing, MI, U.S.A.; Noblis, Falls Church, VA, U.S.A.
Brendan F. Klare, Ben Klein, Emma Taborsky, Austin Blanton, Jordan Cheney, Kristen Allen, Patrick Grother, Alan Mah, Anil K. Jain
Pushing the Frontiers of Unconstrained Face Detection and Recognition: IARPA Janus Benchmark A