Zhejiang Lab; Harbin Institute of Technology, Shenzhen; University of Electronic Science and Technology of China
Jing Xu, Xu Luo, Xinglin Pan, Yanan Li, Wenjie Pei, Zenglin Xu
Few-shot learning;metric learning;image classification
Alleviating the Sample Selection Bias in Few-shot Learning by Removing Projection to the Centroid