Samsung Semiconductor Israel Research and Development Center
Jonathan Zedaka, Elisha Halperin, Evgeny Blaichman, Amit Berman
WGAN;GAN;Autoencoder;Unsupervised Learning;Generative models;Flash Memory;NAND;Modulation;Reliability;Flash;Communication system
Neural Modulation for Flash Memory: An Unsupervised Learning Framework for Improved Reliability