RIKEN AIP and The University of Tokyo; RIKEN AIP; Hong Kong Baptist University; The University of Melbourne; University of Science and Technology of China; TML Lab, The University of Sydney
Xiaobo Xia, Tongliang Liu, Bo Han, Mingming Gong, Jun Yu, Gang Niu, Masashi Sugiyama
Learning with noisy labels;Sample selection;Uncertainty
Sample Selection with Uncertainty of Losses for Learning with Noisy Labels