School of Electrical Engineering, KAIST; Samsung Research, Samsung Electronics; NAVER AI Lab, NAVER
Jinhee Lee, Haeri Kim, Youngkyu Hong, Hye Won Chung
Generative Adversarial Networks (GAN);diversity in sample generation;fair generative model;minor attributes;training dynamics;statistics of log-density ratio;weighted sampling for SGD.
Self-Diagnosing GAN: Diagnosing Underrepresented Samples in Generative Adversarial Networks