Department of Electrical Engineering, KAIST; Korea Institute of Oriental Medicine; Department of Statistics, Jeonbuk National University; Department of Electrical Engineering, KAIST; Kim Jaechul Graduate School of AI, KAIST
Seong Jin Cho, Gwangsu Kim, Junghyun Lee, Jinwoo Shin, Chang Yoo
active learning;uncertainty;closeness;disagree metric;diversity
Querying Easily Flip-flopped Samples for Deep Active Learning