Viterbi Faculty of Electrical and Computer Engineering, Technion – Israel Institute of Technology, Haifa, Israel; CSAIL, Massachusetts Institute of Technology, Cambridge, USA; Applied Mathematics Program, Yale University, New Haven, CT 06511, USA; Department of Pathology, Yale School of Medicine, New Haven, CT 06511, USA
David Cohen, Tal Shnitzer, Yuval Kluger, Ronen Talmon
Few-Sample Feature Selection via Feature Manifold Learning