The Chinese University of Hong Kong, Shenzhen; The Chinese University of Hong Kong, Shenzhen & SRIBD; Tencent AI Lab; University of Toronto & MBZUAI
Xianghong Fang, Jian Li, Qiang Sun, Wang Benyou
Effective uniformity metrics;dimensional collapse;Wasserstein distance;self-supervised learning
Rethinking the Uniformity Metric in Self-Supervised Learning