Samsung Electronics; Seoul National University, Saige Research; Hanyang University, Korea Institute for Advanced Study; Korea Institute for Advanced Study
Sangwoong Yoon, Young-Uk Jin, Yung-Kyun Noh, Frank Park
Energy-based Models;Anomaly Detection;Generative Models;Out-of-Distribution Detection;Recovery Likelihood
Energy-Based Models for Anomaly Detection: A Manifold Diffusion Recovery Approach