Carnegie Mellon University; Vanderbilt University
Yuzhe Lu, Yilong Qin, Runtian Zhai, Andrew Shen, Ketong Chen, Zhenlin Wang, Soheil Kolouri, Simon Stepputtis, Joseph Campbell, Katia Sycara
Distribution Shift;OOD Error Prediction;Optimal Transport;Deep Learning
Characterizing Out-of-Distribution Error via Optimal Transport