College of Computer Science and Technology, Nanjing University of Aeronautics and Astronautics; MIIT Key Laboratory of Pattern Analysis and Machine Intelligence
Wang Xinrui, Wenhai Wan, Chuanxing Geng, Shao-Yuan Li, Songcan Chen
positive and unlabeled learning;machine learning;deep learning;temporal point process;data imbalance
Beyond Myopia: Learning from Positive and Unlabeled Data through Holistic Predictive Trends