Department of Engineering (DIEF), University of Modena and Reggio Emilia, Italy; Department of Information and Computing Science, Utrecht University, the Netherlands; Department of Engineering (DIEF), University of Modena and Reggio Emilia, Italy
Mang Ning, Enver Sangineto, Angelo Porrello, Simone Calderara, Rita Cucchiara
Input Perturbation Reduces Exposure Bias in Diffusion Models