LTCI, Télecom Paris, IP Paris; Université Paris-Saclay, CNRS, Inria, Laboratoire de mathématiques d’Orsay, 91405, Orsay, France; Université Paris-Saclay, Inria, CEA, Palaiseau 91120, France
Binh T. Nguyen, Bertrand Thirion, Sylvain Arlot
high-dimension statistics;sparse logistic regression;variable selection;variable importance;brain-imaging analysis;statistical inference
A Conditional Randomization Test for Sparse Logistic Regression in High-Dimension