eess.SY cond-mat.mtrl-sci cs.SY
Degradation mode estimation using reconstructed open circuit voltage curves from multi-year home storage field data
Jan Figgener Jakob Bors Matthias Kuipers Felix Hildenbrand Mark Junker Lucas Koltermann Philipp Woerner Marc Mennekes David Haberschusz Kai-Philipp Kairies Dirk Uwe Sauer