[□] □ □
[□=□] □ □
[□ & □] □ □
Recently , McNeil et al. ( 1997 ) expressed the need to improve the techniques used to measure the bulk properties of cohesive sediments . Although the literature does not often distinguish between these conditions very clearly , in the present study the two threshold conditions will be identified by measuring the bulk properties of sediment as function of depth for a sufficient vertical resolution . Excluded from this subclass are semiconductive devices whose nonlinear characteristic is due to a junction rather than to the bulk properties of the semiconductor , whether they are homojunctions ( i.e ., made up of the same semiconductor material with different dopant ions on opposite sides of a junction ) or heterojunctions ( i.e ., made up of different materials on either side of a junction ) . Papers are solicited on fundamental and applied studies of the surface and bulk properties of carbon which are important to its electrochemical properties and applications . The next decision is related to the bulk properties of the solute itself .