Scanning electron microscope and X-ray energy dispersive analyses
X-ray energy dispersive spectroscope
To analyze the internal microstructure of the set samples in each experimental subgroup, scanning electron microscope (SEM) (Helios Nanolab 650; FEI, Eindhoven, Netherlands) analysis was employed, and X-ray energy dispersive spectroscope (EDS) analysis was carried out for element analysis. The specimens, which were prepared using the same protocol for each experimental subgroup, were sectioned into two halves using a disposable surgical scalpel blade. The samples were then dehydrated using increasing concentrations of ethanol and were subsequently dried using a critical point drier (Samdri-795; Tousimis Research Corporation, Rockville, MD, USA). Next, the samples were attached to aluminum stubs, and the longitudinally fractured surfaces were coated with iridium and examined using SEM. Additionally, EDS was used to analyze both the general area and specific shaped crystals.