Surface morphology analysis using Atomic Force Microscope (AFM)
Surface morphology analysis was gained using the Atomic Force Microscope (Tosca 200 AFM—Anton Paar GmbH – Germany, tapping mode—500 um increment—rate 1 line/second) in 'contact' mode. Four regions were chosen to have different images which can be scanned by software (Mountains® 8.2 Software—Digital Surf, Besançon, France).