EBIC has also been extended to the study of local defects in insulators. For example, W.S. Lau (Lau Wai Shing) developed "true oxide electron beam induced current" in the 1990s.
EBIC, which examines local defects within insulators, was expanded by W.S. Lau's work on "true oxide electron beam induced current," developed in the 1990s.