an electrical component handler that tests electrical circuit components and includes a self - cleaning lower contact offers reduced yield loss and mean time between assists . a preferred embodiment of the electrical component handler includes multiple sets of upper and lower contacts , each set of which is spatially aligned to electrically contact a single device - under - test . each dut is seated in a test plate that transports the dut to and from a test measurement position between the upper and lower contacts . the lower contact includes a contact tip that a biasing mechanism urges against the electrical component as it undergoes a test process and against a surface of the test plate as it transports the electrical component . the lower contact rubs against the test plate , thereby contributing to removal of contaminant material acquired by the contact tip during component handler operation .