a test tray includes a rectangular shaped frame and a plurality of transport modules to receive a plurality of semiconductor devices . a precise location - determining unit mounted on both sides of the frame to precisely determines and fixes the test tray location . according to one embodiments , the precise location - determining unit includes a locking hole to receive a positioner , a bushing to prevent locking hole wear , a protection bar to cover the frame and the bushing . the test tray prevents yield reduction and handler malfunction , e . g ., sudden stopping of the handler , by precisely fixing tray and semiconductor device position during loading , unloading , and testing . the test tray can be extensively without repair or replacement because locking hole , with protective bushing therein , enjoys little or no wear .