a semiconductor integrated circuit device includes therein a test circuit . the test circuit operates to distinguish the power source level during the testing or ground level occurring at an internal node located inside the semiconductor chip . the test circuit includes a series - connected mis transistor and an mis diode . the gate of the mis transistor is connected to the internal node . the mis diode is connected to an external input / output pin . the level at the internal node , i . e ., the power source level or the ground level , can be distinguished by a first voltage level or a second voltage level applied to the external i / o pin , whichever enables a current to be drawn from the external i / o pin .