systems and methods for providing bias currents to multiple analog circuits are disclosed . an integrated circuit comprises a calibration circuit which compares a high tolerance external component to a plurality of internal components manufactured to span the variability of the process , voltage and temperature . the best fitting internal component is communicated to bias circuits which can select an internal component from a local plurality of internal components with matching desired characteristics . in this manner , analog circuits can be locally biased with the tolerance usually associated with a high tolerance external reference component , without the necessity for a local external reference component .