the crystalline molecular sieve material emm - 7 has , in its as - synthesized form , an x - ray diffraction pattern including d - spacing maxima substantially as set forth in table 1 : table 1 interplanar d - spacing relative intensity , i / i o × 100 8 . 40 ± 0 . 2 w - m 6 . 80 ± 0 . 2 w - s 4 . 46 ± 0 . 1 m - s 3 . 73 ± 0 . 1 m - s 3 . 68 ± 0 . 1 m - s 3 . 40 ± 0 . 1 s - vs wherein “ vs ” means very strong , “ s ” means strong , “ m ” means medium and “ w ” means weak .