a scanning microscope , having a light source for generating an illumination light beam , having at least one objective that focuses the illumination light beam onto and / or into a sample , having a beam deflection apparatus that guides the focus of the illumination light beam over and / or through the sample , and having a detection device that receives detected light emanating from the sample , is disclosed . the scanning microscope is characterized in that a means for generating a manipulation illumination pattern is provided ; and that imaging means image the manipulation illumination pattern onto and / or into the sample .