a method and apparatus for monitoring and controlling integrated circuit devices - under - test . a preferred embodiment includes a computer based controller , a temperature control module , a power supply controller , a chamber interface module , a driver card and a dut board . the computer - based controller responding to preprogrammed instructions operates and coordinates the temperature control module , the chamber interface module , the power supply controller , and the driver card . the driver card , receiving commands and data from the computer - based controller , sends and receives a number of signals to and from the duts on the dut board . these signals include voltage sources for operating the duts , a load voltage , dc current sources for setting duty and frequency cycles , switch signals , voltage measurement signals , and resistance measurement signals . the dut board is a printed circuit board for holding a number of duts . each of the duts is an integrated circuit containing one or more sets of circuitry for testing specifically designed test structures .