the present invention relates to a device for measuring the distribution of selected properties of materials , said device comprises an emitter of electromagnetic radiation and furthermore at least one sensor of a first type . the emitter emits electromagnetic radiation in a selected frequency range towards said materials and a sensor of the first type detects electromagnetic radiation in a selected frequency range coming from said materials . the detected electromagnetic radiation having been emitted by said emitter . the device also comprises means to generate a three dimensional image contour information regarding the said material &# 39 ; s position in space , and an analyser which receives information from said sensors and processes this information and generates signals containing information about the distribution of said properties as output . the invention also relates to a system and a method for measuring the distribution of selected properties of materials .