a broadcaster , system , and method for reducing test data volume and test application time in an ate in a scan - based integrated circuit . the scan - based integrated circuit contains multiple scan chains , each scan chain comprising multiple scan cells coupled in series . the broadcaster is a combinational logic network coupled to an optional virtual scan controller and an optional scan connector . the virtual scan controller controls the operation of the broadcaster . the system transmits virtual scan patterns stored in the ate and generates broadcast scan patterns through the broadcaster for testing manufacturing faults in the scan - based integrated circuit . the number of scan chains that can be supported by the ate is significantly increased . methods are further proposed to reorder scan cells in selected scan chains , to generate the broadcast scan patterns and virtual scan patterns , and to synthesize the broadcaster and a compactor in the scan - based integrated circuit .