an integrated circuit includes an embedded memory device and an on - chip test circuit . the on - chip test circuit includes a multiplexer and one or more i / o circuits . the multiplexer allows the i / o circuits to interface with a plurality of inputs and outputs associated with the embedded memory device . as a result , the embedded memory device in the integrated circuit may be tested or repaired after the embedded memory array portion of the integrated circuit is formed , yet prior to fabrication of dedicated input / output circuitry . this allows evaluation of the embedded memory device in the integrated circuit prior to committing resources to complete fabrication of the entire integrated circuit .