a system for analyzing defects in electronic circuit patterns , including : comparing position information of structural defects with position information of electrical faults and extracting corroborated defects having common position information between the structural defects and electrical faults ; classifying images of extracted corroborated defects into critical defect images and non - critical defect images based on a pre - stored classification rule which defines critical and non - critical defects by referring to images of defects , position information of defects , and results of performing an electronic test ; modifying the pre - stored classification rule by correcting classification of classified defect images displayed on the screen ; and repeating the operations for each subsequent object , wherein for each present object under inspection , using a modified pre - stored classification rule with respect to a previous object , as the pre - stored classification rule for the operations with respect to the present object .