a semiconductor circuit designing apparatus includes a circuit design unit executing and an inspection item database section . the circuit design unit executes a logical design of a semiconductor integrated circuit . in the inspection item database section a circuit feature of the semiconductor integrated circuit corresponds to an inspection item of a inspection to be executed before a layout design of the semiconductor integrated circuit is executed . the circuit design unit generates a target circuit feature information indicating the circuit feature of a target semiconductor integrated circuit of the semiconductor integrated circuit of which the logical design should be executed . the circuit design unit obtains a target inspection item of the inspection item corresponding to the target circuit feature information from the inspection item database section . the circuit design unit executes the logical design of the target semiconductor integrated circuit in reference to the target inspection item .