description will be given below with regard to preferred embodiments of the present invention with reference to the accompanying drawings . fig1 is a schematic view showing the configuration of a charged particle beam exposure apparatus including a d / a conversion device according to a first embodiment of the present invention . the charged particle beam exposure apparatus is configured of an exposure section and a control section as shown in fig1 . the exposure section is configured of a charged particle beam emitting device 20 , a blanking deflector 21 , an aperture plate 22 , an objective lens 23 , and a moving stage 24 . a charged particle beam eb emitted from the charged particle beam emitting device 20 is applied through the blanking deflector 21 , the aperture plate 22 and the objective lens 23 to a wafer 25 mounted on the moving stage 24 . a cross section of the charged particle beam eb shaped by the charged particle beam emitting device 20 is reduced and projected onto the wafer 25 . a main deflector 26 of an electromagnetic deflection type and an auxiliary deflector 27 of an electrostatic deflection type , which are disposed in the objective lens 23 , are used to scan the charged particle beam eb over the wafer 25 . the control section is configured of a storage device 28 , a control circuit 29 a or 29 b , a d / a converter 30 and a current - voltage converter 31 which control the auxiliary deflector 27 in accordance with a signal from the control circuit 29 a or 29 b , a digital volt meter ( dvm ) 32 which measures an output voltage from the current - voltage converter 31 and feeds back a measured value to the control circuit 29 a or 29 b , and a d / a converter 33 and an amplifier 34 which control the main deflector 26 in accordance with a signal from the control circuit 29 a or 29 b . the control circuit 29 a or 29 b performs control based on pattern data read out from the storage device 28 so that the charged particle beam emitting device 20 operates to shape the cross section of the charged particle beam eb . the control circuit 29 a or 29 b also does likewise so that the d / a converter 30 and the current - voltage converter 31 operate to apply a voltage to the auxiliary deflector 27 , and so that the d / a converter 33 and the amplifier 34 operate to feed a current to the main deflector 26 . thereby , an exposure position is determined on the wafer 25 . the d / a converter 33 that controls the main deflector 26 has the same configuration as d / a conversion circuits disposed in the d / a converter 30 that controls the auxiliary deflector 27 , and the d / a converter 33 is provided with a register reg 5 . description will now be given below with reference to the drawings with regard to detailed configurations of the control circuit 29 a , the d / a converter 30 that controls the auxiliary deflector 27 , the current - voltage converter 31 , and the dvm 32 . fig2 is a block diagram showing relative connections of the control circuit 29 a , the d / a converter 30 that controls the auxiliary deflector 27 , the current - voltage converter 31 , and the dvm 32 . as shown in fig2 , the control circuit 29 a is configured mainly of a register ( reg 3 ) 101 , a serial - parallel conversion circuit 102 , a decision circuit 104 , a correction code table 105 , a pointer 106 , an adder circuit 107 , a register ( reg 4 ) 108 , and a clock generator circuit 103 . these circuits and the like , and the d / a converter 30 constitute the d / a conversion device . the control circuit 29 a is provided with , besides the above circuits , a circuit which outputs a deflection control code to the d / a converter 33 that controls the main deflector 26 , and others , although they are not shown in fig2 . the register ( reg 3 ) 101 receives input of plural bits of serial data ( or digital data ) sdat as pattern data from the storage device 28 . the serial - parallel conversion circuit 102 converts the serial data sdat outputted by the register ( reg 3 ) 101 into parallel data ( or digital data ), which in turn is outputted to a first d / a conversion circuit 11 . also , the decision circuit 104 determines whether each of the bits of the serial data sdat outputted by the register ( reg 3 ) 101 is “ 0 ” or “ 1 ” in accordance with a signal from the pointer 106 . the correction code table 105 stores correction codes cc corresponding to the respective bits , and outputs the correction codes cc corresponding to the bits judged as “ i ” by the decision circuit 104 . the adder circuit 107 performs serial addition of the correction codes cc corresponding to the respective bits , and outputs their sum to the register ( reg 4 ) 108 . the register ( reg 4 ) 108 serially stores sum data obtained by adding the correction codes cc , and in the end , stores the correction code cc obtained by adding the correction codes cc for every bit of the digital data . the d / a converter 30 is configured of a first d / a conversion circuit 11 which converts the digital data outputted by the serial - parallel conversion circuit 102 into an electric output signal i , and a second d / a conversion circuit 12 which converts the correction code cc obtained by adding the correction codes cc for all bits of the digital data into an electric correction signal ic . both the first and second d / a conversion circuits 11 and 12 are current output mode circuits . the first d / a conversion circuit 11 is configured of an r - 2r ladder resistor network for the low - order 12 bits d 11 to d 0 and a decoder for the high - order 4 bits d 15 to d 12 , as shown in fig1 . the first d / a conversion circuit 11 has general circuit configuration and functions . incidentally , the first d / a conversion circuit 11 is configured to adjust the values of resistances 400 to 411 and 500 to 511 and output currents from constant current sources 300 to 315 in accordance with the current output level i as employed in the present invention . the second d / a conversion circuit 12 also has the same circuit configuration and functions as the first d / a conversion circuit 11 . incidentally , the second d / a conversion circuit 12 is also configured to adjust the values of resistances and the constant current sources in accordance with the correction current value ic . the d / a conversion circuits 11 and 12 are provided with registers reg 1 and reg 2 , respectively . as shown in fig2 , the registers reg 1 and reg 2 store the digital data and the correction codes cc , respectively , in accordance with a clock from the clock generator circuit 103 of the control circuit 29 a . output terminals of the d / a conversion circuits 11 and 12 are connected to form a common output terminal , which is connected to an input terminal of the current - voltage converter 31 . under control of the clock from the clock generator circuit 103 , the electric output signal i and the electric correction signal ic are outputted to produce output of a current j whose errors are corrected , as shown in fig2 . then , the current - voltage converter 31 converts the current j into a deflecting voltage , which in turn is outputted . an output terminal of the current - voltage converter 31 is connected to an input terminal of the digital volt meter ( dvm ) 32 , and an output terminal of the digital volt meter 32 is connected to a digital voltage ( dv ) input terminal of the control circuit 29 a . this channel can be used to obtain the correction code . the correction code is obtained in a manner as given below . specifically , the first d / a conversion circuit 11 converts digital data with bits ( 0 to n ) sequentially set to “ 1 ” into electric output signals dv 0 to dvn , respectively , which in turn are fed back to the control circuit 29 a . in this case , variations from an ideal output line , in general , occur due to variations in the resistance values of the d / a conversion circuit and the supply currents therefrom . deviations δ 0 to δn ( namely , voltages or currents ) of the measured values of the electric output signals dv 0 to dvn from the ideal output line are therefore determined as shown in fig3 . the deviations δ 0 to δn are digitized to form correction codes , which in turn are prestored in the correction code table 105 . the correction codes are given in fig6 . incidentally , the ideal output line is set so that the sum of correction codes for data dat with all bits set to “ 1 ,” δ 0 + δ 1 + . . . + δ 10 + δ 11 + . . . + δ 26 , is equal to 0 . operation of the control section will now be described below with reference to fig4 and 5 . fig4 is a timing chart showing the flows of signals indicative of digital data ( dat ), correction codes ( cc ), clock pulses ( clk ), data stored in the register ( reg 1 ), data stored in the register ( reg 2 ), output currents i , and correction currents ic . fig5 is a flowchart mainly showing a procedure for obtaining correction codes cc for digital data . as shown in fig4 , first digital data is inputted to the control circuit 29 a , the first digital data ( dat 0 ) is held in the serial - parallel conversion circuit 102 , and a first correction code ( cc 0 ) corresponding to the first digital data ( dat 0 ) is held in the register ( reg 4 ). under control of a first clock ( clk ), the first digital data ( dat 0 ) is held in the register ( reg 1 ) of the d / a conversion circuit 11 , and the first correction code ( cc 0 ) is held in the register ( reg 2 ) of the d / a conversion circuit 12 . then , an output current i 0 is outputted by the d / a conversion circuit 11 , and a correction current ic 0 is outputted by the d / a conversion circuit 12 . after that , the output current i 0 is corrected by the correction current ic 0 , and the corrected current ( j ) is converted into a voltage , which in turn is outputted to the auxiliary deflector . before a next clock ( clk ), second digital data is inputted to the control circuit 29 a , the second digital data ( dat 1 ) is held in the serial - parallel conversion circuit 102 , and a second correction code ( cc 1 ) corresponding to the second digital data ( dat 1 ) is held in the register ( reg 4 ). under control of a second clock ( clk ), the second digital data ( dat 1 ) is held in the register ( reg 1 ) of the d / a conversion circuit 11 , and the second correction code ( cc 1 ) is held in the register ( reg 2 ) of the d / a conversion circuit 12 . then , an output current i 1 is outputted by the d / a conversion circuit 11 , and a correction current ic 1 is outputted by the d / a conversion circuit 12 . after that , the output current i 1 is corrected by the correction current ic 1 , and the corrected current ( j ) is converted into a voltage , which in turn is outputted to the auxiliary deflector . thereafter , processing is performed on sequentially incoming digital data for deflection control to thereby sequentially convert the digital data into corresponding voltages . the auxiliary deflector is operated under control of the voltages . in this case , the correction code ( cc ) is generated within the control circuit 29 a through the following steps p 1 to p 8 as shown in fig5 . ( p 1 ) first , the correction codes derived from the deviations δ 0 to δn of the measured values of the electric output signals dv 0 to dvn from the ideal output line are stored in the correction code table 105 . ( p 2 ) then , 0 is assigned to p , where p denotes the value of the pointer 106 . ( p 3 ) then , 1 bit of the input serial data sdat , corresponding to the value p of the pointer 106 , is stored in the register ( reg 3 ) 101 . ( p 4 ) then , the decision circuit 104 determines the bit value of the register ( reg 3 ) 101 , pointed to by the pointer 106 . ( p 5 ) then , when the bit value is “ 0 ,” the variable p is incremented by 1 , and the processing returns to step p 3 . when the bit value is “ 1 ,” the processing proceeds to step p 6 . ( p 6 ) then , an error correcting code for the corresponding bit is read by referring to the error correcting code table 105 shown in fig6 , the error correcting code is added to the previous sum stored in the register ( reg 4 ) 108 , and the resultant sum is stored in the register ( reg 4 ) 108 . ( p 7 ) then , when p is less than r ( p & lt ; r ), the variable p is incremented by 1 , and the processing returns to step p 3 . when p is equal to r ( p = r ), the processing proceeds to step p 8 . as employed herein , r denotes the number of bits of the data sdat minus one . as employed in the first embodiment , r is equal to 15 ( r = 15 ). ( p 8 ) then , the value of the register ( reg 4 ) 108 is fed to the second d / a conversion circuit 12 , as the correction code cc . in a case where sdat =“ 1011010011001011 ”, for example , the error correcting codes corresponding to bits set to “ 1 ” are as follows . error correcting code for bit 2 15 . . . 1101000110010111 error correcting code for bit 2 13 . . . 0111100001000001 error correcting code for bit 2 12 . . . 1010111001100011 error correcting code for bit 2 10 . . . 0110001111100110 error correcting code for bit 2 7 . . . 0000110000000010 error correcting code for bit 2 6 . . . 0000011000111110 error correcting code for bit 2 3 . . . 1101001110010010 error correcting code for bit 2 1 . . . 1001010011011001 error correcting code for bit 2 0 . . . 0100001001110010 all these correcting codes are added , and an msb ( most significant bit ) is determined . as a result , the correction code cc is “ 1000001100100111 .” as described above , the control circuit 29 a and the d / a converter 30 for use in the charged particle beam exposure apparatus according to the first embodiment of the present invention are configured so that the control circuit 29 a is provided with the error correcting code table 105 that stores the error correcting codes corresponding to bits . this eliminates the need for storing the correction codes for all incoming digital data , thus eliminating the need for an expensive memory of wasteful access time . moreover , the execution of steps p 3 to p 8 makes it possible to determine the correction code for input digital data both at high speed and in real time . description will now be given with reference to fig7 with regard to the control circuit 29 b , the d / a converter 30 that controls the auxiliary deflector 27 , the current - voltage converter 31 , and the dvm 32 for use in a charged particle beam exposure apparatus according to a second embodiment of the present invention . fig7 is a block diagram showing the control circuit 29 b , the d / a converter 30 that controls the auxiliary deflector 27 , the current - voltage converter 31 , and the dvm 32 . the control circuit 29 b and others according to the second embodiment are different from the control circuit 29 a and others according to the first embodiment shown in fig2 in that the former uses an expanded correction code table 114 which stores correction codes each for two bits , in place of the error correcting code table 105 that stores the correction codes each for one bit . thus , the control circuit 29 b and others are different from the control circuit 29 a and others in that the former obtains expanded correction codes each for 2 bits of input serial data . incidentally , as shown in fig7 , circuits and others in the control circuit 29 b and the d / a converter 30 constitute a d / a conversion device . in this case , the expanded correction codes are obtained in a manner as given below . specifically , the first d / a conversion circuit 11 converts digital data with bits ( 0 to n ) sequentially set to “ 1 ” into electric output signals dv 0 to dvn , respectively , which in turn are fed back to the control circuit 29 b . in a manner as shown in fig3 , the deviations δ 0 to δn of the measured values of the electric output signals dv 0 to dvn from the ideal output line are determined and then digitized . the deviations δ 0 to δn are each processed into a 16 - bit digital data . additions are performed based on the deviations δ 0 to δn . specifically , the deviations δ 0 to δn are added for combinations of the low - order or high - order 2 bits , that is , (“ 0 ”, “ 0 ”), (“ 0 ”, “ 1 ”), (“ 1 ”, “ 0 ”), and (“ 1 ”, “ 1 ”). for example , when the combination of bit 1 and bit 0 is (“ 1 ”, “ 0 ”), addition is performed to determine the deviation ( δ 1 ) of bit 1 plus the deviation ( zero ) of bit 0 . when the combination is (“ 1 ”, “ 1 ”), addition is performed to determine the deviation ( δ 1 ) of bit 1 plus the deviation ( δ 0 ) of bit 0 . calculations are likewise performed for other combinations . the expanded correction codes are given in fig9 . the expanded correction codes determined in the manner as above mentioned are prestored in the expanded correction code table 114 . description will now be given below with reference to fig8 with regard to the operation of the control section and particularly to operation for generating the correction code cc based on the expanded correction codes . since the general operation of the control section as a whole is the same as the operation shown in the timing chart of fig4 , description is omitted in this respect . ( p 11 ) first , the expanded correction codes , each of which is obtained for every 2 bits , based on the deviations δ 0 to δn of the measured values of the electric output signals dv 0 to dvn from the ideal line , are stored in the expanded correction code table 114 . ( p 12 ) then , the low - order 2 bits of input serial data sdat are stored in a register ( reg 3 ) 111 . 1 is assigned to s , where s denotes the value of a pointer 115 . ( p 13 ) combinations of the 2 bits in the register ( reg 3 ) 111 are compared to combinations of the bits in the expanded correction code table 114 pointed to by the pointer 115 , the corresponding expanded correction code is added to a register ( reg 4 ) 117 , and the resultant sum is stored in the register ( reg 4 ) 117 . ( p 14 ) then , the processing goes to step p 15 when s is less than t ( s & lt ; t ), or the processing goes to step p 16 when s is equal to t ( s = t ), where t denotes the number of bits of the data sdat divided by the number of bits , the unit of which undergoes serial arithmetic operation . as employed in the second embodiment , t is equal to 8 ( t = 8 ). ( p 15 ) then , the next 2 bits of the serial data sdat are stored in the register ( reg 3 ) 111 , which in turn is shifted right two bit positions . also , the variable s is incremented by 1 , and the processing returns to step p 13 . ( p 16 ) then , the value of the register ( reg 4 ) 117 as the correction code cc is fed to the second d / a conversion circuit 12 . in a case where sdat =“ 0011001101010010 ”, for example , the expanded correction codes each corresponding to 2 bits , referring to the expanded correction code table 114 shown in fig9 are as follows . expanded correction code for bits 2 15 and 2 14 . . . 0000000000000000 expanded correction code for bits 2 13 and 2 12 . . . 0100100111011110 expanded correction code for bits 2 11 and 2 10 . . . 0000000000000000 expanded correction code for bits 2 9 and 2 8 . . . 0111001111101000 expanded correction code for bits 2 7 and 2 6 . . . 0000011000111110 expanded correction code for bits 2 5 and 2 4 . . . 0110100001001001 expanded correction code for bits 2 3 and 2 2 . . . 0000000000000000 expanded correction code for bits 2 1 and 2 0 . . . 1001010011011001 all these expanded correction codes each for 2 bits are added , and an msb is determined . as a result , the correction code cc for the digital data is “ 1110000010010011 .” as described above , the control circuit 29 b and the d / a converter 30 for use in the charged particle beam exposure apparatus according to the second embodiment of the present invention are configured so that the control circuit 29 b is provided with the expanded correction code table 114 that stores the correction codes each corresponding to plural bits . as in the case of the first embodiment , this eliminates the need for holding the correction codes for all incoming digital data and thus eliminates the need for an expensive memory of wasteful access time . moreover , the execution of steps p 11 to p 16 makes it possible to determine the correction code for input digital data both at high speed and in real time . moreover , serial arithmetic operation is sequentially performed on every plural bits of input serial data , so that the number of calculations can be reduced . this makes it possible to serially calculate the expanded correction codes each for the plural bits on all bits of the input serial data , thus enabling a further reduction in the number of calculations . this leads to higher operation speed . furthermore , the control circuit 29 b and the d / a converter 30 having the above configuration , as applied to a deflector for charged particle beam scan , can achieve both higher accuracy of exposure position and shorter exposure standby time without using a large - capacity memory . while this invention has been described in detail above in connection with certain exemplary embodiments , it is to be understood that the subject matter encompassed by way of this invention is not to be limited to those specific embodiments . on the contrary , it is intended for the subject matter of the invention to include all alternatives , modifications and equivalents as can be included within the spirit and scope of this invention . for example , the first d / a conversion circuit 11 , as employed in the above embodiments , is configured of the r - 2r ladder resistor network for the low - order 12 bits and the decoder for the high - order 4 bits as shown in fig1 , but the d / a conversion circuit 11 is not limited to this . the first d / a conversion circuit 11 may be configured of the r - 2r ladder resistor network or the decoder for all bits . the same goes for the second d / a conversion circuit 12 .