the circuit layout 1 shown in fig1 is taken as an example to describe how the method and computer system , according to a preferred embodiment of the invention , test whether the requirements necessary for testing of the circuit layout 1 are sufficient . although fig1 only shows a portion of the circuit layout 1 , those who skilled in the art should know that the illustrated portion of the circuit layout 1 is sufficient to present the whole circuit layout 1 and to support the following description . the circuit layout 1 includes a plurality of pin pads 10 , a plurality of nets 11 for connecting the pin pads 10 , and a plurality of test pads 12 for testing . the test pads 12 are respectively connected to the corresponding pin pads 10 via the nets 11 . the test pads 12 further include a plurality of groups of power test pads 120 , which relate to the power input . each group of the power test pads 120 has a different level input voltage . for example , the group of the power test pads 120 a has a group name of “+ 5v ” and is used at a voltage of + 5v . the group of the power test pads 120 b has a group name of “+ 3 . 3v ” and is used at a voltage of + 3 . 3v . although the circuit layout 1 is a graphic file generated using layout software , the information in the graphic file circuit layout 1 ( as shown in fig1 ), such as the names , coordinates , numbers , areas , and other details for the pin pads 10 , nets 11 , test pads 12 and power test pads 120 , can be transformed into one or more text files . this transformation function is usually provided by the present layout software . the first file 2 shown in fig2 is an illustration showing a transformed text file using the present layout software . the first file 2 shows the column titles including the part name 21 , the pin number 22 , the index 23 , the x coordinate of the pin pad 24 , the y coordinate of the pin pad 25 , the layer name 26 , the net name 27 , and the nail ( s ) 28 , wherein the index 23 refers to the name of the pin pad , and the nail ( s ) 28 refer to whether the pin pad 10 is connected to the corresponding test pad 12 . in the first file 2 , the value of nail ( s ) 28 is “ 0 ” when the pin pad 10 is connected to the test pad 12 , and the value of nail ( s ) 28 is blank when the pin pad 10 is unconnected to the test pad 12 . fig3 shows a third file 5 , which is also a transformed text file generated by present layout software and which corresponds to the circuit layout 1 . the third file 5 lists the column titles , such as the nail ( s ) 51 , the x coordinate of the test pad 52 , the y coordinate of the test pad 53 , the test pad type 54 , the test pad grid 55 , the type of test pad area 56 , the net number 57 , the net name 58 , and other information ( or data ) thereof . as shown in fig4 , the second file 3 records the column titles , such as the index 31 , the suggestion 32 , and the priority 33 , and the information ( or data ) thereof . as shown in fig5 , the information is the layout arranging rule 99 is established according to the test requirements . the information corresponding to the priority 33 represents whether it is absolutely necessary to connect one pin pad 10 ( as shown in fig1 ) to one test pad 12 ( as shown in fig1 ). for example , the pin pad 10 labeled a 2 is defined as “ absolutely necessary ”, while the pin pad 10 named a 6 is labeled as “ not essential ”. a safety value and a safety distance are established according to the layout arranging rule 99 . the safety value and the safety distance are defined in a diagnosing program 4 . with reference to fig5 , the first file 2 , the third file 5 , the second file 3 , and the diagnosing program 4 are all inputted into a computer system 6 . in the current embodiment , the computer system 6 performs diagnosing program 4 , in order to diagnose whether the circuit layout 1 matches the layout arranging rule 99 , as follows : 1 . the pin pad 10 , which is defined as “ absolutely necessary ” to be connected to the test pad 12 , must be connected to one test pad 12 in the circuit layout 1 . 2 . the total number of the power test pads 120 in each group of the circuit layout 1 must be greater than 5 . 3 . the interval between two neighboring test pads 12 must be longer than 50 mils . according to the preferred embodiment of the invention , the computer system 6 includes at least a central process unit ( cpu ) and a storage unit which is used to read the first file 2 , the third file 5 , and the second file 3 , and to execute the diagnosing program 4 . thus , portions of the information recorded in the first file 2 which violate the layout arranging rule 99 are picked out . also , the test pads recorded in the third file 5 which have the same group name , and which violate the safety value and the safety distance defined in the diagnosing program 4 , are also noted . the first file 2 and the third file 5 can represent the actual details of circuit layout 1 , and the safety value and the safety distance defined in the diagnosing program 4 can represent the layout arranging rule 99 of the circuit layout 1 . accordingly , after the testing procedures described above , any portion of the circuit layout 1 which violates the layout arranging rule 99 would be discovered by the computer system 6 and then listed in a report 7 . more specifically , the computer system 6 can perform the following steps to diagnose whether the circuit layout 1 matches the anticipated requirements of the layout arranging rule 99 . referring to fig6 , the steps include : reading the first file 2 , which was previously obtained ; reading the second file 2 , which was previously established ; executing the diagnosing program 4 to compare the contents of the first file 2 and the second file 3 so as to find the differences in information between the first file 2 and the second file 3 , and , for example , to find the portion of the circuit layout 1 which violates the layout arranging rule 99 ; listing the pin pad 10 which violates the layout arranging rule 99 and which requires connection with an additional test pad 12 ; reading the third file 5 , which was previously obtained ; executing the diagnosing program 4 to count the total number of the power test pads in each group , and , for example , to determine each power test pad 120 inside the third file 5 and count the total number of power test pads with the same group name ; obtaining a difference value between the previously obtained safety value and the total number of power test pads in each group ; and determining whether the difference value is greater than zero , and , when the difference value is greater than zero , the data of the difference value is set as “ 0 ”. when the difference value is not greater than zero , the difference value and the name of this group of power test pads 120 are listed in the report . in addition , the diagnosing program 4 may be further executed to calculate the interval between two neighboring test pads 12 ; and to list the test pads 12 having an interval of less than the safety distance . the safety distance is 50 mils in the present embodiment . the diagnosing program 4 is then executed to generate a report 7 , which lists each pin pad 10 in the circuit layout 1 which violates the layout arranging rule 99 and requires connection with an additional test pad 12 , the name of each group of the power test pads 120 , the corresponding difference value , and the test pads 12 which have an interval of less than the safety distance . since the first file 2 and the second file 3 are both in excel format , the diagnosing program 4 can be written by the vba program language . for example , according to the value corresponding to the column labeled nail ( s ) 28 ( shown in fig2 ), the pin pad 10 , which is unconnected to any test pad 12 , is sought out from the first file 2 . afterwards , the searched pin pads 10 and the values corresponding to the column labeled priority 33 of the second file 3 are compared one by one . thus , the pin pad 10 , which is the pin pad 12 shown as being “ absolutely necessary ” to be connected to the test pad 12 and is actually unconnected to any test pad 12 , is found . the diagnosing program 4 can also find the power test pads 120 with the same group name , such as “+ 5v ”, and count the total number of the power test pads in each group . the total number is then compared with the safety value so as to determine which group has the total number that is insufficient and requires the additional power test pad 120 . as shown in fig3 , the total number of the power test pads 120 having the same group name of “+ 5v ” is “ 1 ,” which is less than the anticipated safety value , such as “ 5 ”. thus , 4 additional power test pads 120 are required for this group of power test pads 120 . the diagnosing program 4 can further calculate the difference value between the interval and the safety distance according to the recorded information of the test pad 12 such as the columns titled with the x coordinate of the test pad 52 , the y coordinate of the test pad 53 , the test pad type 54 , the test pad grid 55 , the test pad area 56 , and the group name 58 in the third file 5 . the diagnosing program 4 can then determine which test pads 12 having interval violated the requirements , such as lower than 50 mils . finally , the diagnosing program 4 can generate a report 7 , which is in excel format , so as to receive and to record the diagnosing results described above . with reference to fig7 , the substantial content of the report 7 is shown and includes three portions , wherein : the first portion is used to represent which pin pad 10 is absolute necessarily to be connected to the addition test pad 12 , and , for example , the pin pad 10 with the group name of “ pci - ck - 33m - lpc ” is the one that should be connected to the addition test pad 12 ; the second portion is used to represent which group of the power test pads 120 has the total number less than the safety value , such as “ 5 ”, and needs the additional power test pad 120 , and , as shown in fig7 , the total number of the power test pads 120 with the group name of “+ 5v ” is 1 and less than the safety value , such as “ 5 ”, so that 4 additional power test pads 120 are required ; and the third portion is used to represent which test pads 12 have the interval less than the safety distance , such as “ 50 mils ”, and need an increased interval , and , as shown in fig7 , there are four test pads 12 which violate the requirement . it should be noted that the information ( or data ) presented in the third file 5 could be included in the first file 2 . in other words , the definitions of the circuit layout 1 can be completely recorded in the first file 2 . accordingly , the diagnosing program 4 can be performed according to the first file 2 with appropriate additional column ( s ), so as to obtain the information stated in the first , second , and third portions of the report 7 . in the present embodiment of the invention , the computer system 6 is used to read the previously - obtained first file 2 and the previously - established second file 3 , and then executes the diagnosing program 4 , which functions to compare , sort , search build files , and the like . thus , the portion of the circuit layout 1 which does not match the anticipated requirement is found by comparing the content of the first file 2 and the second file 3 . by the means of this computerized testing , the circuit layout 1 can be rapidly and accurately tested so as to find out whether the circuit layout 1 matches the design requirements for testing , and , in particular , the test pin arrangement . compared with the conventional , manual testing of a circuit layout , the present invention uses a computer system to process diagnosing of the circuit layout . therefore , the diagnosing method of the invention is much faster and more accurate , and uses less manpower and time , thereby making this invention both useful and non - obvious . moreover , there is no disclosure , which is the same as or similar to the invention in the field , disclosed in prior , and the invention could be thus patentable and is filed . although the invention has been described with reference to specific embodiments , this description is not meant to be construed in a limiting sense . various modifications of the disclosed embodiments , as well as alternative embodiments , will be apparent to persons skilled in the art . it is , therefore , contemplated that the appended claims will cover all modifications that fall within the true scope of the invention .