as shown in the drawings and described in detail below , the invention is embodied in an electrical lapping guide for individual sliders . the resistance of the electrical lapping guide may be monitored during lapping , providing an unambiguous indication of lapping progression . after lapping is complete , a connection to the electrical lapping guide may be removed thus causing the electrical lapping guide to become electrically inactive . fig1 shows a slider 102 as attached to a suspension 104 and flying above the surface 106 of the disk 108 . when operating , the disk 108 spins in a direction indicated by arrow 110 . the slider 102 typically has a disk facing side ( not shown ) upon which the air bearing is constructed . this side of the slider is sometimes referred to as the air bearing surface although the air bearing surface itself usually includes a plurality of recesses formed disk facing side of the slider 102 to control aerodynamic pressure forces between the slider 102 and the disk surface 106 . the recording head 112 is normally constructed on the trailing surface 114 of the slider 102 . the leading edge of the air 105 bearing surface has an optional tapered portion 116 , which helps in forming a uniform air bearing . fig2 a shows a perspective drawing of a typical slider 202 . fig2 a shows the front surface 204 of the slider 202 , the optional tapered region 206 , and the air bearing 208 . the optional tapered region 206 in fig2 a is illustrated as reference 116 in fig1 . there are many air bearing designs differing somewhat in geometrical features . the common aspect of air bearing designs is that most are comprised of two or more surfaces which are recessed or offset from one another . in the example shown in fig2 a there are three such surfaces . the first surface is shown as segments 210 , 212 , and 214 . these segments are not contiguous but lie in approximately the same plane and therefore are referred to as a single surface . the next surface is indicated by segments 216 , 218 , and 220 . these segments are also not contiguous but lie in approximately the same plane . the plane defined by segments 216 , 218 , and 220 is recessed compared with the plane defined by segments 210 , 212 , and 214 . the recessed or offset distance varies according to the design requirements of the air bearing and is typically from about 0 . 1 to 0 . 5 μm . the third surface 222 in fig2 a is typically less than 4 . 0 μm recessed or offset from the plane defined by segments 210 , 212 , and 214 . the location of the recording head 224 is near the trailing edge 226 of the air bearing 208 . recessed surfaces are typically formed by ion milling or reactive ion etching through openings in appropriate masks . fig2 b illustrates a side view of the slider 202 . the front surface 204 and the optional tapered region 206 are viewed in profile . the recessed distance 226 of the plane defined by segments 210 , 212 , 214 and the plane defined by segments 216 , 218 , and 220 is illustrated . also the recessed distance 228 of the plane defined by segments 216 , 218 , 220 and the plane shown by reference number 222 is illustrated . fig2 c illustrates a view of the air bearing 208 side of the slider 202 . the optional tapered region 206 is illustrated . the surface defined by segments 210 , 212 , and 214 is illustrated . the surface defined by segments 216 , 218 and 220 is illustrated . and finally , the surface 222 is illustrated . fig3 illustrates one embodiment of the invention . fig3 shows the trailing surface 302 of a typical slider 300 . constructed on the trailing surface 302 is a read element 304 , two connection pads 306 , 308 connected by metallic conductors 310 to the read element 304 , a write element ( not shown ), two connection pads 312 , 314 connected by metallic conductors 316 to the write element ( not shown ), and an electrical lapping guide 318 . the electrical lapping guide 318 is a resistive thin film member with two conductive leads 320 , 322 . one lead 320 connects the electrical lapping guide 318 to one of the read element connection pads 308 . the other conductive lead 322 connects the electrical lapping guide 318 to one of the write element connection pads 314 . for visual clarity in fig3 the conductors 310 , 316 for the read element 304 and write element ( not shown ) are not shown in complete detail . although one specific example of an electrical lapping guide is illustrated in fig3 the invention is not limited by that specific example . other specific arrangements are possible without departing from the scope of the invention . for example the electrical lapping guide can be on the left side of the trailing surface of the slider and the connection pads may have a different order . alternately , additional dedicated connection pads may used , however there is limited space on the trailing surface of the slider for additional pads . referring again to fig3 the resistance of the electrical lapping guide 318 is measured between the connection pads 308 , 314 during lapping . since neither the read element 304 nor the write element ( not shown ) is in parallel connection with these two pads 308 , 314 during lapping , the measured resistance is an unambiguous indication of the state of the electrical lapping guide 318 . fig4 a , b , c , and d illustrate the electrical lapping guide 400 in more detail . fig4 a illustrates a resistive thin film member 402 having two ends and electrical leads 404 , 406 attached to the ends of the resistive thin film member 402 . the resistive thin film member 402 is conveniently formed along with the read element ( 304 in fig3 ) and of the same materials as the read element . forming the resistive thin film member 402 along with the read element greatly simplifies the task of aligning the resistive thin film member 402 with the read element . proper alignment is necessary for the resistance of the electrical lapping guide to indicate the lapped state of the read element . if alignment is not adequate the resistance of the resistive thin film member 402 during lapping may not be an adequate indication of the stripe height of the read element . alternatively the resistive thin film member 402 may be formed of other resistive materials using different process steps . if different process steps are used to make the read element and the electrical lapping guide , the task of achieving good alignment may be more difficult . the electrical leads to the resistive thin film member 402 are conveniently formed of tantalum , tungsten , titanium , alloys of nickel - iron , or other suitable materials . preferably , the resistivity and thickness of the electrical leads 404 , 406 are chosen such that the resistance of the electrical leads 404 , 406 is substantially less than the resistance of the resistive thin film member 402 . during lapping , a portion of at least one of the leads 404 and the resistive thin film member 402 will be removed . the dashed line 408 in fig4 a indicates an example of the extent of final lapping . fig4 b illustrates the electrical lapping guide 400 after lapping to the location indicated by the dashed line 408 . at least one of the electrical leads 404 to the resistive thin film element 402 has a shallow portion 410 to facilitate removal . it is desirable to remove the electrical connection to the resistive thin film member 402 in order to avoid electrical interference during the subsequent use of the read or write element . the preferred method of removing the shallow portion 410 of the electrical lead 404 is to form a window 412 in the mask 414 which is used to construct the air bearing . fig4 c illustrates an example of utilizing a window in the air bearing mask to expose the shallow portion 410 of the electrical lead 404 during ion milling or reactive ion etching . ion milling may be used to mill away the shallow portion 410 of the electrical lead 404 and can be achieved with the ion milling used to create the air bearing thus conserving the number of process steps . alternatively reactive ion etching using an effective gas mixture may be used to etch away the shallow portion 410 of the electrical lead 404 . electrical leads formed from tantalum , tungsten , and titanium are readily removed with many reactive ion etching gas mixtures . if an alloy of nickel and iron is used as the material in the electrical leads then a reactive ion etching using a gas mixture of co / nh 3 is effective . very selective differential etch rates are possible with reactive ion etching methods because the etch rate of the usual alumina - titanium carbide material used for sliders is very low . one alternate removal method is using a laser to ablate the shallow portion of the electrical lead . another alternate removal method is to use high current to melt the shallow portion of the electrical lead . the magnitude of current necessary to melt the shallow portion of the electrical lead depends on the material and the thickness of the material . the magnitude of current may be as low as 10 ma and as high as a few tens of milliamps . the duration of the current need be only a few milliseconds . these latter two methods are effective but require additonal apparatus . again referring to fig4 a , b , c , and d , when using ion etching to remove the shallow portion 410 of the electrical lead 404 the height 416 of the shallow portion 410 should generally be less than 4 μm and preferably less than 1 μm . when using reactive ion etching to remove the shallow portion 410 of the electrical lead 404 , the height 416 of the shallow portion 410 should generally be less than 1 μm . therefore in general , it is preferable that the height 416 of the shallow portion 410 of the electrical lead 404 ( after lapping and before removal ) is limited to approximately 1 μm or less . electrical leads with a height significantly greater than one micrometer may not be completely removed during milling or etching . fig4 d illustrates the absence of the shallow portion of the electrical lead 404 after removal thereof . fig5 a shows a detailed view of an example of a window in the air bearing mask used to expose the electrical lapping guide for removal . the trailing pad 502 ( also illustrated with reference 214 in fig2 a , c ) of the air bearing is illustrated in fig5 a . the shielded read element 504 is usually sandwiched in a insulating material 506 on the trailing surface 520 of the slider . the electrical lapping guide 508 is preferable coplanar with the read element 504 . when the mask for the air bearing is applied to the disk facing surface of the slider a small window 510 , indicated by the area enclosed by the dashed line 512 , is used to expose the electrical lapping guide 508 . preferably the area exposed by the window 510 in the mask is only a few micrometers in extent so that the pocket or void created when the shallow portion of the electrical lead is milled or etched has little or no effect on the performance of the air bearing . the expanded perspective view 514 in fig5 a illustrates the enclosed pocket 516 remaining in the trailing pad 502 after removal of the shallow portion of the electrical lead . fig5 b illustrates an alternate placement of the window 510 . in this embodiment , the window 510 in the mask extends beyond the trailing edge 518 of the trailing pad 502 . the pocket 516 remaining in the trailing pad 502 after removal of the shallow portion of the electrical lead extends to the trailing surface 520 of the slider . the pocket 516 is not enclosed toward the trailing surface 520 and accordingly may have a slight effect on the performance of the air bearing . fig6 illustrates a typical apparatus used to collect resistance information from the electrical lapping guide . typically a constant current 602 is passed through the resistive thin film member 604 . the voltage 606 across the resistive thin film member is then measured . the relationship between the measured voltage 606 and the height 608 and width 610 of the resistive thin film member 604 is given by : where i is the current , ρ is the sheet resistance of the resistive thin film member , w is the width of the resistive thin film member , and h is the height of the thin film member . those skilled in the art will recognize that there is a small correction which can be made for the finite resistance of the electrical leads . the method of using the present invention is summarized in fig7 . first a resistive thin film member ( 418 in fig4 a ) is formed 702 on the trailing surface ( 302 in fig3 ) of a slider ( 300 in fig3 ). one electrical lead ( 320 in fig3 ) is formed connecting the resistive thin film member ( 418 in fig4 a ) with a read element connection pad ( 308 in fig3 ). one electrical lead ( 322 in fig3 ) is formed connecting the resistive thin film member ( 418 in fig4 a ) with a write element connection pad ( 314 in fig3 ). one of the electrical leads ( 404 in fig4 a ) is formed 704 having a shallow portion ( 410 in fig4 b ) to facilitate removal . during lapping the resistance of the electrical lapping guide ( 318 in fig3 ) is measured 706 . after lapping is complete , the shallow portion ( 410 in fig4 b ) of the portion of the electrical lead ( 404 in fig4 a ) is removed 708 . from the foregoing it will be apparent that the electrical lapping guide provided by the invention offers several advantages . for example , the electrical lapping guide is readily suitable for use on an individual slider ; no additional connection pads are required ; and , the connection to the electrical lapping guide may be removed after lapping to avoid interference with subsequent use of the read or write element . although specific embodiments of the invention have been described and illustrated , the invention is not to be limited to the specific embodiments thus explicitly described . the invention is limited only by the claims .