fig1 shows a scanning microscope 1 according to the present invention that contains an imaging module 3 and a modularly attached means 37 for generating a manipulation illumination pattern . imaging module 3 contains a light source 5 that emits an illumination light beam 7 . illumination light beam 7 is reflected by main beam splitter 9 to a beam deflection device 11 that contains a gimbal - mounted scanning mirror 13 . beam deflection device 11 guides illumination light beam 7 through scanning optical system 15 , tube optical system 17 , and microscope objective 19 and over or through sample 21 . detected light 23 emanating from sample 21 travels along the same light path , i . e . through microscope objective 19 , tube optical system 17 , scanning optical system 15 , and via beam deflection device 11 back to main beam splitter 9 , traverses the latter and detection pinhole 25 that follows it , and lastly arrives at a detector 29 that is configured as a photomultiplier 27 . detector 29 generates electrical detected signals proportional to the power level of detected light 23 , which are transferred to a processing unit 31 . in processing unit 31 , the detected signals are allocated to the corresponding position signals and then transferred to a pc 33 , on whose screen 35 an image of the sample is displayed . means 37 for generating a manipulation illumination pattern is attached to the imaging module via a bayonet connector 51 . means 37 for generating a manipulation illumination pattern contains a laser 39 whose manipulation light 41 travels via optical system 47 to lcd element 43 . lcd element 43 is controlled by pc 33 , and generates the manipulation illumination pattern that is imaged via optical systems 49 , 55 into the intermediate image plane of the scanning microscope . the manipulation illumination pattern is deflected , by an incoupling means 57 that is embodied as a prism 53 and is arranged in the intermediate image plane , to tube optical system 17 , which together with microscope objective 19 images the manipulation illumination pattern onto or into sample 21 . incoupling means 57 is arranged displaceably in such a way that the portion that is effective in the beam path of the scanning microscope is variable . fig2 shows a variant of the scanning microscope according to the present invention in which means 37 for generating a manipulation illumination pattern encompasses a laser diode array 59 of individually switchable laser diodes . manipulation light 41 emanating from the laser diode array is imaged by a microoptical system 61 onto an optical fiber bundle 63 . in order to couple manipulation light 41 out of optical fiber bundle 63 , a further microoptical system 65 is provided which images the manipulation illumination pattern into the intermediate image field of the scanning microscope . an incoupling means 57 , which in this variant is embodied as a dichroic beam splitter 67 , is provided in the intermediate image plane . the manipulation illumination pattern that is imaged by tube optical system 17 and microscope objective 19 into sample 21 can be varied by switching the individual diodes of laser diode array 59 . as a result , each individual fiber of the fiber bundle is , de facto , individually addressable . fig3 shows a further variant of a scanning microscope according to the present invention having an addressable optical fiber bundle 63 . in this variant , the beveled end surface 69 of optical fiber bundle 63 is arranged directly in the intermediate image plane . the manipulation light emerging from optical fiber bundle 63 is deflected by refraction , and directed onto the beam path of the scanning microscope . in this variant , tube optical system 17 and microscope objective 19 image end surface 69 of optical fiber bundle 63 into sample 21 . the end of optical fiber bundle 63 can be positioned in controlled fashion in the intermediate image plane , as indicated by the double arrow . the positioning is controlled by processing unit 31 and by pc 33 . fig3 a is a detail view of the end of optical fiber bundle 63 . depending on how laser diode array 59 is activated , manipulation light emerges from the individual fibers of optical fiber bundle 63 , the power level of polarized light 41 passing through the individual fibers of optical fiber bundle 63 being controllable by pc 33 . fig4 shows another embodiment of a scanning microscope 1 according to the present invention . scanning microscope 1 contains a light source 5 that emits an illumination light beam 7 that is directed through an acoustooptical filter 71 ( aotf = acoustooptical tunable filter ) to main beam splitter 9 . light source 5 is embodied as a multiple - line laser 73 . with the aid of acoustooptical filter 71 , it is possible to select which spectral component of illumination light 7 is to travel through the main beam splitter to beam deflection device 11 and , via the scanning and tube optical systems ( not shown ) and microscope objective 19 , to sample 21 . the spectral components that are not directed onto the beam path of the scanning microscope travel into a beam trap 75 . acoustooptical filter 71 is driven via a high - frequency transmitter 77 that is regulated by a processing unit 31 . scanning microscope 1 comprises a means 37 for generating a manipulation illumination pattern , which means contains a laser 39 that emits manipulation light 41 . those spectral components that are to be imaged for the manipulation of sample 21 are selected from manipulation light 41 with a further acoustooptical filter 79 . all the other spectral components travel into a further light trap 81 . further acoustooptical filter 79 is driven via a further high - frequency transmitter 83 . means 37 for generating a manipulation illumination pattern contains a controllable micromirror array 85 . the manipulation illumination pattern is generated by exerting control on the individual mirrors of micromirror array 85 . the manipulation illumination pattern is imaged into the sample with imaging means 87 that contain a field lens 89 and a condenser 91 . the invention has been described with reference to a particular embodiment . it is self - evident , however , that changes and modifications can be made without thereby leaving the range of protection of the claims below . while this invention has been particularly shown and described with references to preferred embodiments thereof , it will be understood by those skilled in the art that various changes in form and details may be made therein without departing from the scope of the invention encompassed by the appended claims .