a method , apparatus , and computer program are provided for correcting the voltage across a thin oxide complementary metal - oxide semiconductor capacitor . due to ever - decreasing thicknesses of capacitors in cmos applications , leakage through the capacitor by electron tunneling and impurities has become a significant problem . for example , in phased lock loops , leaky capacitors can cause static phase errors . to combat the problem , a scaled capacitor and current mirrors are used to provide a correction current to a leaky capacitor to maintain a proper voltages .