the present invention generally relates to a low temperature plasma probe for desorbing and ionizing at least one analyte in a sample material and methods of use thereof . in one embodiment , the invention generally relates to a low temperature plasma probe including : a housing having a discharge gas inlet port , a probe tip , two electrodes , and a dielectric barrier , in which the two electrodes are separated by the dielectric barrier , in which application of voltage from a power supply generates a low temperature plasma , and in which the low temperature plasma is propelled out of the discharge region by the electric field and / or the discharge gas flow .