a method for identifying an integrated circuit having a latent defect . test data corresponding to a set of integrated circuits is obtained , where the set of integrated circuits was processed on a single substrate . a subject integrated circuit is selected for analysis from within the set . a subset of integrated circuits is identified from within the set , where the subset includes integrated circuits that were located in close proximity on the substrate to the subject integrated circuit . the test data for the subset is analyzed to determine a defect parameter for the subset . the defect parameter for the subset is compared to a threshold . the subject integrated circuit is classified as having a latent defect when the defect parameter for the subset violates the threshold , and the subject integrated circuit is classified as not having a latent defect when the defect parameter for the subset does not violate the threshold .