techniques for ion beam current measurement using a scanning beam current transformer are disclosed . in one particular exemplary embodiment , the techniques may be realized as an apparatus for ion beam current measurement using a transformer . the apparatus may comprise a measurement device positioned adjacent a wafer and an ion dose control module coupled to the measurement device . the measurement device may comprise a transformer through which an ion beam passes onto the wafer . the ion dose control module may calculate ion beam current passing through the transformer and adjust dose based at least in part upon the calculated ion beam current .