a method of applying a phosphor according to a light - emission characteristic of semiconductor light - emitting devices so as to increase a yield rate of manufacture with respect to a white light - emitting device chip , the method including the operations of testing light - emission characteristics of a plurality of light - emitting devices formed on a wafer ; disposing a plurality of light - emitting devices having the same light - emission characteristics on a carrier substrate ; applying a same phosphor to the plurality of light - emitting devices disposed on the carrier substrate ; and separating the plurality of arrayed light - emitting devices . thus , a white light - emitting device chip manufactured by using the method may emit almost the same white light .