automated test equipment used to test semiconductor components during the manufacturing process . the ate generates and measures signals at test points of a device under test . the ate includes a signal formatter with an sr latch having set and reset inputs each connected through or coupled to a number of signal channels . each signal channel may receive a long pulse from a timing generator and generate a short pulse . each signal channel has a current steering circuit that couples the short pulses to the set or reset ports of the latch . because the outputs of each current steering circuit have a high impedance when not sending a pulse , multiplexing circuitry and / or circuitry to logically or the outputs of separate signal channels are unnecessary . the hardware eliminated by this design simplifies and improves the ate . additionally , the latch can be set and reset in quick succession with good timing resolution .