there is disclosed a semiconductor integrated circuit device capable of eliminating an influence of a power voltage drop generated in a circuit disposed in the semiconductor integrated circuit device to inhibit an operation defect or an operation speed decrease of the circuit . in a semiconductor integrated circuit device 10 including a power wiring 18 connected to a power supply via a power terminal 12 , a ground wiring 20 connected to a ground via a ground terminal 14 , and a plurality of circuits 301 to 30 f connected in parallel with one another between the power wiring 18 and the ground wiring 20 , a negative power terminal 16 connected to a negative power supply is disposed , and a current source 22 is disposed as a current generating section between the negative power terminal 16 and a node gf on a ground wiring 20 side of the f - th circuit 30 f disposed in a region most distant from the ground .