the invention relates to a method and a device for measuring the temperature t x of any material or object , by using a microwave radiation , as well as to an application of said method for determining the coefficient of hyperfrequency reflection of any material or object . according to the method , the microwave radiation emitted through an antenna is captured and the signals received are directed towards signal processing means . additionally , between the antenna and said means , a given impedance line is intercalated whose impedance is a function of the input impedance of said means , and with a length l much bigger than the wave length of processed signals , so that the correlation factor of said means is negligible . furthermore , the output voltage is processed by calculation of all parameters by cylindrically modifying the structure of said processing means .