a device test handler and a method for operating the same provide a significant reduction of the picking up and placing time periods , and reduce possible damage to the devices being tested . devices and methods embodying the invention facilitate room temperature and high temperature testing within one device test handler to maximize testing efficiency . a test handler embodying the invention may include a pre - heater for pre - heating the devices on a loading shuttle as the loading shuttle passes to a test chamber . an indexing device in a test chamber of the device is used for successively transferring the devices from a loading shuttle to the test socket , and tested devices from the test socket to an unloading shuttle . heat supply means may be provided for supplying a high temperature heat to the test chamber when the devices are required to be tested in a hot state . an unloading part having a plurality of trays movably fitted on the base is used to transfer devices from an unloading shuttle to output trays based on the testing results .