a system and method are disclosed for automated testing of electronic devices . an original test is performed on a model product while the model product is coupled to a test recorder . during the test , the model product is manipulated to invoke a desired response . as the test is performed , the manipulations and the desired responses are recorded by the test recorder in an executable format . subsequently , a test analyzer is coupled to a to - be - tested product , and the executable recording of the test is played such that the to - be - tested product is manipulated as the model product had been manipulated during the original test . the to - be - tested product &# 39 ; s responses to the manipulations are compared against the model product &# 39 ; s responses . any difference between the to - be - tested product &# 39 ; s responses and the model product &# 39 ; s responses are identified .