disclosed is a system and method for testing electronic devices which uses a random pattern for testing electronic devices . in one embodiment there is communicated to a device under test a test sequence causing the dut to exercise certain parameters in a controlled pattern of operation . the test sequence is randomly created . in one embodiment this random creation is controlled by a random looping algorithm which controls both the order of and the magnitude of each parameter . included , if desired , is the ability to selectively retransmit previously communicated test sequences .