a circuit and method is described for automatically testing multiple ldo regulator circuits on an integrated circuit chip independent of an ate . each ldo regulator is tested for voltage at a specified current output capability , wherein the output driver transistor is formed by at least two pass transistors , which are each tested for voltage output at a particular current capability . the test results are delivered back to the ate and for a failed test , the gate voltage of the pass device can be observed through an analog multiplexer to enable debug .