a circuit and method of testing an analog driver circuit using digital scan - based test methodologies . the circuit of the present invention comprises a control circuit for generating signals in response to a test enable signal , a differential driver circuit for receiving a differential input signal , amplifying the differential input signal and transmitting a differential output signal in response to the differential input signal and the signals generated by the control circuit , a programmable termination impedance circuit for generating a differential termination impedance at the output node of the differential driver circuit in response the signals generated by the control circuit , and a differential receiver circuit for receiving the differential output from the differential driver circuit , convert the differential output signal to a single ended signal and transmitting the single ended signal , all in response to the test enable signal . the method of the present invention comprises digitally testing the differential driver circuit by activating a test enable signal , skewing the differential output termination impedance in response to the test enable signal , adjusting a voltage offset of the differential receiver circuit in response to the test enable signal , selecting a power level for the differential driver circuit in response to the test enable signal , enabling a decoder in response to the test enable signal , wherein the decoder activates only one segment of the differential driver circuit during any one test sequence , activating one of the segments for testing , stimulating the differential driver circuit with digital test patterns , receiving an output of the differential driver circuit by the differential receiver circuit , converting the received differential driver output to a single - ended signal , observing the single - ended signal ; and deactivating the test enable signal .