disclosed is a method for fabricating devices so that several devices at a time can be tested and sorted . the devices are placed in a carrier so that each device occupies a discrete position . the carrier includes an identification marker , and each device is identified by its position in the carrier . the carrier is sent to multiple assembly and / or testing stations , and data for each device is collected and stored in a central data base according to its position in the carrier . each device may then be sorted according to the collected data and its position in the carrier .