a method and apparatus to use an atomic force microscope to take measurements of surface forces , indentation , adhesion and mechanical properties such as hardness and elasticity . the force between a probe mounted cantilever and a sample is measured as a function cantilever deflection measured by a electron tunneling microscope . the sample and the tip of the tunneling microscope are each mounted on piezoelectric manipulators which provide for position control . position of the sample and probe are measured from the voltages applied to the piezoelectric manipulators . penetration is determined by the relative motion between the probe and sample . presently , this invention has a force resolution of 1 nn and a depth resolution of 0 . 02 nm .