Single-pixel imaging, originally developed in light optics,
facilitates
fast three-dimensional sample reconstruction as well as probing with
light wavelengths undetectable by conventional multi-pixel detectors.
However, the spatial resolution of optics-based single-pixel microscopy
is limited by diffraction to hundreds of nanometers. Here, we propose
an implementation of single-pixel imaging relying on attainable modifications
of currently available ultrafast electron microscopes in which optically
modulated electrons are used instead of photons to achieve subnanometer
spatially and temporally resolved single-pixel imaging. We simulate
electron beam profiles generated by interaction with the optical field
produced by an externally programmable spatial light modulator and
demonstrate the feasibility of the method by showing that the sample
image and its temporal evolution can be reconstructed using realistic
imperfect illumination patterns. Electron single-pixel imaging holds
strong potential for application in low-dose probing of beam-sensitive
biological and molecular samples, including rapid screening during
in situ experiments.