In this manuscript, we construct an attribute control chart (ACC) for the number of defective items using time-truncated life tests (TTLT) when the lifetime of a manufacturing item follows two lifetime data distributions: the half-normal distribution (HND) and the half-exponential power distribution (HEPD). To assess the potential of the proposed charts, necessary derivations are made to obtain the value of the average run length (ARL) when the production process is in-control and out-of-control. The performance of the presented charts is evaluated for different sample sizes, control coefficients, and truncated constants for shifted phases in terms of ARL. The behavior of ARLs is studied for the shifted process by introducing shifts in its parameters. The advantages of the proposed HEPD-based chart are discussed in the form of ARLs with HND and Exponential Distribution (ED) based ACCs under TTLT, showing the excellent assessment of the proposed chart. Additionally, the advantages of another proposed ACC using HND are compared with ED-based ACC, and the findings support the HND in the form of smaller ARLs. Finally, simulation testing and real-life implementation are also discussed for functional purposes.