Electrical Contact Resistance | Bruker

Electrical Contact Resistance

Electrical Contact Resistance for Electron Microscopes

Conductive nanoindentation involves passing a current through the indenter probe and sample interface. This technique has commonly been used to study stress-induced phase transformations, oxide fracture, MEMS contact switch resistance fatigue, nanoscale breakdown voltage, and piezoelectric material response. When performed in-situ, the combined electromechanical response can be characterized, while the current resulting from the electron beam of the microscope represents a constant offset which can be easily subtracted, leaving only the desired material response. Site-specific testing can be performed by confirming proper tip placement with electron microscope imaging. Through-tip electrical measurements can also be used to gain insight into electromechanical properties of micro- or nano-structures such as pillars and particles. Humidity or water adsorption effects are minimized by the vacuum environment of the electron microscope.


Microscope Instruments for Electrical Contact Resistance

Hysitron PI 85L SEM PicoIndenter | Bruker

PI 85L SEM PicoIndenter


Hysitron PI 88 SEM PicoIndenter | Bruker

PI 88 SEM PicoIndenter



Hysitron PI 95 TEM PicoIndenter | Bruker

PI 95 TEM PicoIndenter
