Towards a Bias-Free Selection Function in Shear Measurement
Sample selection is a necessary preparation for weak lensing measurement. It is well-known that selection itself may introduce bias in the measured shear signal. Using image simulation and the Fourier_Quad shear measurement pipeline, we quantify the selection bias in various commonly used selection function (signal-to-noise-ratio, magnitude, etc.). We proposed a new selection function defined in the power spectrum of the galaxy image. This new selection function has low selection bias, and it is particularly convenient for shear measurement pipelines based on Fourier transformation.