A simple miniature controlled-atmosphere chamber for optoelectronic characterizations
Abstract A simple, controlled-atmosphere chamber that allows optical and electrical device characterization of samples is described. It can be used as a reusable encapsulation method or as a controlled atmospheric chamber for a variety of experiments, for example, lifetime testing of organic optoelectronic devices. In this paper, designs are included for this system as well as a description on how to scale it if desired. Chambers based on these designs and their elements were characterized using helium leaking checking as well as monitored for moisture ingress with an electrical calcium test. Finally, chambers were used to encapsulate organic photovoltaic devices to demonstrate the effective stable environment provided by this platform over the course of weeks.