Pushing the limits of analytical characterization tools: How much is too much?
Abstract The world of nanotechnology would not exist without representative nanomaterials whose unique and extraordinary properties have opened a new dimension of research. Research activity in nanotechnology includes processing and/or fabrication, characterization, modeling studies, etc. Characterization/analytical tools are of pivotal importance for understanding the impact of nanomaterials on their properties, applications, and performance in nanotechnology. A plethora of analytical tools is in use today for characterization; each one has its strengths and limitations. However, it is important to realize that the relevance of any given analytical tool depends on certain parameters, e.g., length scale (dimension) of the material, its shape and form, simulated conditions (if any) needed for measurements, etc. Otherwise, analyses may become pointless with irrelevant or erroneous information. In this chapter, we aim to address such issues (along with representative cases) where a cautious understanding is sought for making researchers aware of the potential analytical errors/misjudgments. Efforts have been made to elucidate with different case studies specific examples of structural and thermal characterization techniques; X-ray diffraction and differential scanning calorimetry have been the two chosen analytical tools. Case studies will involve selected phenomena that are frequently used for analytical characterization purposes using these two tools. The analyses involving the selected characterization technique are aimed at revealing the risks of errors, different pathways of analyzing the same case, cautions needed for carrying out such tests at different length scales, etc. A whole range of materials, e.g., metal (and alloys), ceramic, polymer, protein, composites, etc., have been used (at various length scales) as examples to highlight the fact that the changes in the system of materials can also push analytical tools to their limits.