G06N5047
Please help me predict the CPC LABEL for this patentPATENT ABSTRACT: The present invention generally relates to systems and methods for visual process analysis. The disclosed techniques can include: obtaining a theoretical and an empirical process model, generating a theoretical process layout corresponding to the theoretical process model, where the theoretical process layout is generated using a layout algorithm, generating an empirical process layout corresponding to the empirical process model, where the empirical process layout is generated using the layout algorithm, superposing the empirical process layout onto the theoretical process layout, such that a superposition layout is generated, annotating the superposition layout based on ugliness indicators, such that an annotated superposition layout is generated, and causing the annotated superposition layout to be displayed.