The disclosed herein relates to a method for failure rate prediction of a feature of a system under development. The method is executed by a processor coupled to a memory. The method includes defining a feature state of the feature during a predetermined time interval, the predetermined time interval being associated with a development stage of the system. The method also includes assigning a first defect class value to the feature for the predetermined time interval, the first defect class value configured to indicate a first condition and selecting, when a defect is reported for the feature, a second defect class value indicating a second condition, the second condition being associated with a higher failure rate than the first condition. The method can be embodied in system and a computer program product.
Please help me write a proper abstract based on the patent claims. CLAIM: 1. A method for failure rate prediction of a feature of a system under development, the method executed by a processor coupled to a memory, comprising: defining a feature state of the feature during a predetermined time interval, the predetermined time interval being associated with a development stage of the system; assigning a first defect class value to the feature for the predetermined time interval, the first defect class value configured to indicate a first condition; and selecting, when a defect is reported for the feature, a second defect class value indicating a second condition, the second condition being associated with a higher failure rate than the first condition. 2. The method of claim 1, the selecting of the second defect class value further comprising: receiving, for a subsequent time interval where a change to the feature occurred, the second defect class value. 3. The method of claim 1, wherein the change to the feature corresponds to the defect. 4. The method of claim 1, wherein the feature is a product component of the system. 5. The method of claim 1, wherein the feature is represented by a feature index and a finite state. 6. A computer program product, the computer program product comprising a computer readable storage medium having program instructions for failure rate prediction of a feature of a system under development embodied therewith, the program instructions executable by a processor to cause the processor to perform: defining a feature state of the feature during a predetermined time interval, the predetermined time interval being associated with a development stage of the system; assigning a first defect class value to the feature for the predetermined time interval, the first defect class value configured to indicate a first condition; and selecting, when a defect is reported for the feature, a second defect class value indicating a second condition, the second condition being associated with a higher failure rate than the first condition. 7. The computer program product of claim 6, wherein with respect to the selecting of the second defect class value the program instructions are further executable by the processor to cause: receiving, for a subsequent time interval where a change to the feature occurred, the second defect class value. 8. The computer program product of claim 6, wherein the change to the feature corresponds to the defect. 9. The computer program product of claim 6, wherein the feature is a product component of the system. 10. The computer program product of claim 6, wherein the feature is represented by a feature index and a finite state. 11. A system, comprising a processor and a memory storing program instructions for failure rate prediction of a feature of a system under development thereon, the program instructions executable by a processor to cause the system to perform: defining a feature state of the feature during a predetermined time interval, the predetermined time interval being associated with a development stage of the system; assigning a first defect class value to the feature for the predetermined time interval, the first defect class value configured to indicate a first condition; and selecting, when a defect is reported for the feature, a second defect class value indicating a second condition, the second condition being associated with a higher failure rate than the first condition. 12. The system of claim 11, wherein with respect to the selecting of the second defect class value the program instructions are further executable by the processor to cause the system to perform: receiving, for a subsequent time interval where a change to the feature occurred, the second defect class value. 13. The system of claim 11, wherein the change to the feature corresponds to the defect. 14. The system of claim 11, wherein the feature is a product component of the system. 15. The system of claim 11, wherein the feature is represented by a feature index and a finite state.