An electronic system, e.g. a power supply, includes elements, and the elements include devices that limit reliability of the electronic system. A system that can monitor parameters that affect electronic system reliability such as temperature, and parameters that can predict power supply failure such as bulk capacitor ESR, includes a monitoring system measuring and monitoring at least one reliability limiting parameter of at least one of the devices connected to the monitoring system. A method for estimating and predicting a failure of the electronic system includes: measuring parameters affecting or associating the reliability of the device by sensors, collecting the measured sensor data and/or other data by a communications unit, and communicating the data to a computing device for processing and predicting a failure of the device and alerting to the failure.
Please help me write a proper abstract based on the patent claims. CLAIM: 1. An electronic system comprising elements and the elements comprising devices that limit reliability of the electronic system, wherein at least one of the devices is connected to a monitoring system measuring and monitoring at least one reliability limiting parameter. 2. The electronic system according to claim 1, wherein the electronic system comprises a power supply, the elements comprise an AC-DC converter, a power factor correction, a bus converter, and a point of load regulation, and one of said elements is connected to the monitoring system measuring and monitoring at least one reliability limiting parameter. 3. The electronic system according to claim 1, wherein the monitoring system comprises sensors for measuring device parameters, a communications unit communicating with the sensors, a computing unit connected to the communications unit, and a storage means associated with the computing unit. 4. The electronic system according to claim 3, wherein the communications unit is connected to a local embedded host by a local communications bus, and the embedded host is located within a facility where the monitoring system is located. 5. The electronic system according to claim 3, wherein the computing unit and the storage means are located within a facility where the at least one of the devices connected to the monitoring system is located. 6. The electronic system according to claim 3, wherein the computing unit and the storage means are located outside a facility where the at least one of the devices connected to the monitoring system is located. 7. The electronic system according to claim 6, wherein the computing unit and the storage means are located in a different facility than where the at least one of the devices connected to the monitoring system is located. 8. The electronic system according to claim 8, wherein the computing unit and the storage means are located at a remote data-center. 9. The electronic system according to claim 2, wherein the monitoring system is connected over cloud computing means with other power supplies and sensors of the other power supplies building up a database of parameters. 10. The electronic system according to claim 3, wherein the computing unit comprises an ASIC or a FPGA. 11. The electronic system according to claim 3, wherein the computing unit is connected to indicator function means. 12. The electronic system according to claim 11 wherein the indicator function means comprises at least one of a light emitting diode or a status register. 13. The electronic system according to claim 1, wherein the monitoring system is incorporated into a digital power control IC or a power management integrated circuit (PMIC) comprising all power controllers, sensors, estimators, observers and communications and processing logic. 14. A method for estimating and predicting a reliability limiting failure of an electronic system comprising the following steps: measuring parameters affecting or associating reliability of a device by sensors, collecting measured sensor data and/or other data by a communications unit, communicating the data to a computing unit for processing, and predicting a failure of the device and alerting to the failure. 15. The method for estimating and predicting a reliability limiting failure of an electronic system according to claim 11, wherein the computing unit runs a machine learning program for estimating, learning and predicting the failure of the device. 16. The method for estimating and predicting a reliability limiting failure of an electronic system according to claim 12, wherein the machine learning program processes the collected and communicated sensor data and/or other data. 17. The method for estimating and predicting a reliability limiting failure of an electronic system according to claim 11, wherein the machine learning program uses at least one of the following algorithms: Anomaly Detection, Neural Network, K-Nearest Neighbor, Linear Regression, Markov Chain Monte Carlo, Hidden Markov Modelling, Naive Bayes or Decision Trees. 18. The method for estimating and predicting a reliability limiting failure of an electronic system according to claim 11, wherein the computing unit is used in a cloud based environment, and is configured via a web interface.