G06N5047
Please help me predict the CPC LABEL for this patentPATENT ABSTRACT: A method is provided for creating pattern-problem pairs for proactive diagnosis of device issues. A plurality of problem reports are received from problem devices, each having parameters associated with a device profile. The problem reports are parsed to standardize and normalize terms. The parsed problem reports are analyzed to identify common problems in a set of such problem devices where there is a common set of parameters in a pattern. If the frequency of the problems in the set of devices exceeds a threshold, the parsed problem is associated with the pattern for future proactive diagnosis of a target device having the pattern, even without a problem report from the target device. A method of proactively diagnosing a potential problem on a device using such pattern-problem pairs is also provided.