G06N504
Please help me predict the CPC LABEL for this patentPATENT ABSTRACT: A method and system for predicting system states is provided. The method includes receiving a first reference model associated with a first operational attribute of a system from a first integrated circuit internally comprising a first processing circuit and a first sensor measuring a first parameter of the system. Additionally, a second reference model associated with a second operational attribute of the system is received from a second integrated circuit internally comprising a second processing circuit and a second sensor measuring a second parameter of the system. A combination reference model based on the first reference model and the second reference model is generated and a predicted future state and associated operational attributes for the system are determined based on the combination reference model.