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Please predict whether this patent is acceptable.PATENT ABSTRACT: Methods and apparatus are provided for estimating anomalous sensors. The apparatus includes a target data acquiring to acquire a plurality of sets of target data serving as an examination target, each set of target data being output by a plurality of sensors. The apparatus further includes a calculating section calculate, for each of a plurality of sensor groups such that each sensor group includes at least two sensors among the plurality of sensors, a degree of difference of a target data distribution of the plurality of sets of target data relative to a reference data distribution of output from the sensor group. The apparatus additionally includes an estimating section to estimate one or more sensors among the plurality of sensors to be a source of outlierness, based on a calculation result of the calculating section.