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Please predict whether this patent is acceptable.PATENT ABSTRACT: A method for selecting bit widths for a fixed point machine learning model includes evaluating a sensitivity of model accuracy to bit widths at each computational stage of the model. The method also includes selecting a bit width for parameters, and/or intermediate calculations in the computational stages of the mode. The bit width for the parameters and the bit width for the intermediate calculations may be different. The selected bit width may be determined based on the sensitivity evaluation.