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Please predict whether this patent is acceptable.PATENT ABSTRACT: An electronic system, e.g. a power supply, includes elements, and the elements include devices that limit reliability of the electronic system. A system that can monitor parameters that affect electronic system reliability such as temperature, and parameters that can predict power supply failure such as bulk capacitor ESR, includes a monitoring system measuring and monitoring at least one reliability limiting parameter of at least one of the devices connected to the monitoring system. A method for estimating and predicting a failure of the electronic system includes: measuring parameters affecting or associating the reliability of the device by sensors, collecting the measured sensor data and/or other data by a communications unit, and communicating the data to a computing device for processing and predicting a failure of the device and alerting to the failure.