A system includes host and learning machines. Each machine has a processor in electrical communication with at least one sensor. Instructions for predicting a binary quality status of an item of interest during a repeatable process are recorded in memory. The binary quality status includes passing and failing binary classes. The learning machine receives signals from the at least one sensor and identifies candidate features. Features are extracted from the candidate features, each more predictive of the binary quality status. The extracted features are mapped to a dimensional space having a number of dimensions proportional to the number of extracted features. The dimensional space includes most of the passing class and excludes at least 90 percent of the failing class. Received signals are compared to the boundaries of the recorded dimensional space to predict, in real time, the binary quality status of a subsequent item of interest.
Please help me write a proper abstract based on the patent claims. CLAIM: 1. A system comprising: a host machine and a learning machine, each having a respective processor, wherein the processors are in electrical communication with at least one sensor; and tangible, non-transitory memory on which is recorded instructions for predicting a binary quality status of an item of interest during a repeatable process, wherein the binary quality status includes a passing and a failing binary class, and wherein the learning machine is configured to execute the instructions via the processor of the learning machine to thereby: receive signals from the at least one sensor; identify a set of candidate features as a function of the received signals; extract a plurality of features from the set of candidate features, each being more predictive of the binary quality status relative to other non-extracted features in the set of candidate features; map the extracted features to a dimensional space having a number of dimensions that is proportional to the number of extracted features, wherein the dimensional space includes most of the items of interest from the passing binary class and excludes at least 90 percent of the items of interest from the failing binary class; and record the dimensional space in the memory; wherein the host machine is programmed to compare the received signals for a subsequent item of interest to the boundaries of the recorded dimensional space during the repeatable process to thereby predict, in real time, the binary quality status of the subsequent item of interest. 2. The system of claim 1, further comprising a status projector in communication with the host machine, wherein the host machine is configured to indicate the predicted binary quality status directly on the item of interest by activating the status projector. 3. The system of claim 1, wherein the item of interest is a weld and the repeatable process is a vibration welding process. 4. The system of claim 1, wherein the learning machine is further configured to automatically create a rule matrix having multiple rows, with one row of the rule matrix being designated for each of the extracted plurality of features, and wherein the rule matrix defines at least one of an upper and a lower boundary for each row in the matrix. 5. The system of claim 1, wherein the host machine is programmed to determine an error rate during the repeatable process, and to automatically increase or shrink the size of the dimensional space as a function of the error rate. 6. The system of claim 1, wherein the at least one sensor includes an acoustic sensor connected to one of a welding horn and an anvil of a vibration welding system, and wherein the repeatable process is a vibration welding process used to form a weld as the item of interest. 7. The system of claim 1, wherein the learning machine is programmed to map the extracted features by finding, for each extracted feature, the tail and a boundary that optimizes a criterion function quantifying the suitability of the extracted feature and the tail for classification into one of the passing and the failing binary classes.