PENDING
Please predict whether this patent is acceptable.PATENT ABSTRACT: Technologies for monitoring a characteristic of a monitored system include determining a measured value of the primary characteristic of the monitored system sensed by a primary sensor and a measured value of the secondary characteristic of the monitored system sensed by a secondary sensor, and predicating a predicted value of the primary characteristic based on the measured value of the secondary characteristic. The measured and predicted values of the primary characteristic are used to determine whether the primary sensor is properly functioning.