Observation of the Quantum Zeno Effect on a NISQ Device
We study the Quantum Zeno Effect (QZE) on a single qubit on IBM Quantum
Experience devices under the effect of multiple measurements. We consider two
possible cases: the Rabi evolution and the free decay. SPAM error mitigations
have also been applied. In both cases we observe the occurrence of the QZE as
an increasing of the survival probability with the number of measurements.
Andrea Alessandrini Carola Ciaramelletti Simone Paganelli