Measuring error rates of mid-circuit measurements
High-fidelity mid-circuit measurements, which read out the state of specific
qubits in a multiqubit processor without destroying them or disrupting their
neighbors, are a critical component for useful quantum computing. They enable
fault-tolerant quantum error correction, dynamic circuits, and other paths to
solving classically intractable problems. But there are almost no methods to
assess their performance comprehensively. We address this gap by introducing
the first randomized benchmarking protocol that measures the rate at which
mid-circuit measurements induce errors in many-qubit circuits. Using this
protocol, we detect and eliminate previously undetected measurement-induced
crosstalk in a 20-qubit trapped-ion quantum computer. Then, we use the same
protocol to measure the rate of measurement-induced crosstalk error on a
27-qubit IBM Q processor, and quantify how much of that error is eliminated by
dynamical decoupling.
Daniel Hothem Jordan Hines Charles Baldwin Dan Gresh Robin Blume-Kohout Timothy Proctor