A randomized benchmarking suite for mid-circuit measurements
Mid-circuit measurements are a key component in many quantum information
computing protocols, including quantum error correction, fault-tolerant logical
operations, and measurement based quantum computing. As such, techniques to
quickly and efficiently characterize or benchmark their performance are of
great interest. Beyond the measured qubit, it is also relevant to determine
what, if any, impact mid-circuit measurement has on adjacent, unmeasured,
spectator qubits. Here, we present a mid-circuit measurement benchmarking suite
developed from the ubiquitous paradigm of randomized benchmarking. We show how
our benchmarking suite can be used to both detect as well as quantify errors on
both measured and spectator qubits, including measurement-induced errors on
spectator qubits and entangling errors between measured and spectator qubits.
We demonstrate the scalability of our suite by simultaneously characterizing
mid-circuit measurement on multiple qubits from an IBM Quantum Falcon device,
and support our experimental results with numerical simulations. Further, using
a mid-circuit measurement tomography protocol we establish the nature of the
errors identified by our benchmarking suite.
L. C. G. Govia P. Jurcevic C. J. Wood N. Kanazawa S. T. Merkel D. C. McKay