{"instruction": "You are an expert in named entity recognition. Please extract entities that match the schema definition from the input. Return an empty list if the entity type does not exist. Please respond in the format of a JSON string.", "schema": ["manufacturing standard", "machine or equipment", "process parameter", "manufacturing process", "enabling technology", "material"], "input": "The inter-layer areas were proved to be the weak link in the deposited component by scanning electron microscope ( SEM ) and electron backscatter diffraction ( EBSD ) analysis results , including various phase composition , phase morphology , misorientation angle , grain size , Schmid factor , and texture ."}
{"manufacturing standard": [], "machine or equipment": ["component", "scanning electron microscope"], "process parameter": ["areas"], "manufacturing process": [], "enabling technology": [], "material": ["be"]}