 Similar techniques allows scanning and precise detection of small particles.As the combined image keeps both amplitude and phase information, the interferometric microscopy can be especially efficient for the phase objects, allowing detection of light variations of index of refraction, which cause the phase shift or the light passing through for a small fraction of a radian.Although the Interferometric microscopy has been demonstrated only for optical images (visible light), this technique may find application in high resolution atom optics, or optics of neutral atom beams (see Atomic de Broglie microscope), where the Numerical aperture is usually very limited
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