A chart of Minority Carrier Lifetime (no Auger Correction) vs. Minority Carrier Density used in Photoconductance decay measurement. This example PCD measurement was conducted on a p-type float zone silicon wafer passivated with a 10 nm amorphous silicon coating.
with τeff(Δn){\displaystyle \tau _{eff}(\Delta n)} evaluated at 1×1015cm−3{\displaystyle 1\times 10^{15}{\rm {cm}}^{-3}} to 660 μs.
Own work
Radiotrefoil