The manifold topographic techniques can be categorized according to several criteria.
One of them is the distinction between restricted-beam techniques on the one hand (such as section topography or pinhole topography) and extended-beam techniques on the other hand, which use the full width and intensity of the incoming beam. Another, independent distinction is between integrated-wave topography, making use of the full spectrum of incoming X-ray wavelengths and divergences, and plane-wave (monochromatic) topopgraphy, more selective in both wavelengths and divergence. Integrated-wave topography can be realized as either single-crystal or double-crystal topography. Further distinctions include the one between topography in reflection geometry (Bragg-case) and in transmission geometry (Laue case).
For a full discussion and a graphical hierarchy of topographic techniques, see
[https://web.archive.org/web/20041107130433/http://www.esrf.fr/exp_facilities/ID19/homepage/DiffTopo/X-raytopography.htm].