After being scattered by the sample, the profile of the diffracted beam needs to be detected by a two-dimensionally resolving X-ray detector. The classical "detector" is X-ray sensitive film, with nuclear plates as a traditional alternative. The first step beyond these "offline" detectors were the so-called image plates, although limited in readout speed and spatial resolution. Since about the mid-1990s, CCD cameras have emerged as a practical alternative, offering many advantages such as fast online readout and the possibility to record entire image series in place. X-ray sensitive CCD cameras, especially those with spatial resolution in the micrometer range, are now well established as electronic detectors for topography. A promising further option for the future may be pixel detectors, although their limited spatial resolution may restrict their usefulness for topography.
General criteria for judging the practical usefulness of detectors for topography applications include spatial resolution, sensitivity, dynamic range ("color depth", in black-white mode), readout speed, weight (important for mounting on diffractometer arms), and price.