The x-ray beam used for topography is generated by an x-ray source, typically either a laboratory x-ray tube (fixed or rotating) or a synchrotron source. The latter offers advantages due to its higher beam intensity, lower divergence, and its continuous wavelength spectrum. X-ray tubes are still useful, however, due to easier access and continuous availability, and are often used for initial screening of samples and/or training of new staff.
For white beam topography, not much more is required: most often, a set of slits to precisely define the beam shape and a (well polished) vacuum exit window will suffice. For those topography techniques requiring a monochromatic x-ray beam, an additional crystal monochromator is mandatory. A typical configuration at synchrotron sources is a combination of two Silicon crystals, both with surfaces oriented parallel to [111]-lattice planes, in geometrically opposite orientation. This guarantees relatively high intensity, good wavelength selectivity (about 1 part in 10000) and the possibility to change the target wavelength without having to change the beam position ("fixed exit").