In powder samples there is a tendency for plate- or rod-like crystallites to align themselves along the axis of a cylindrical sample holder. In solid polycrystalline samples the production of the material may result in greater volume fraction of certain crystal orientations (commonly referred to as texture). In such cases the reflex intensities will vary from that predicted for a completely random distribution. Rietveld allowed for moderate cases of the former by introducing a correction factor:
where  is the intensity expected for a random sample,  is the preferred orientation parameter and  is the acute angle between the scattering vector and the normal of the crystallites.