* Conventional (C)TEM-CBED: In CTEM-CBED different shape condenser apertures are used to obtain the intensity distribution over the entire Brillouin zone. 
* Large Angle (LA)CBED: (LA)CBED is performed with a large incident angle, ranging from 1˚ to 10˚. LACBED makes it possible to obtain non-overlapping disks with a larger diameter than the one determined by the Bragg angle. With LACBED I one can obtain one selected CBED disk at a time on a detector. In LACBED II, with a slight change in the focusing conditions of the intermediate lens, bright field patterns and dark field patterns can be obtained simultaneously, without overlapping each other on the fluorescent screen. A disadvantage of LACBED is that it requires a large, flat specimen.
* 4D-STEM: In 4D-STEM a convergent probing beam is raster-scanned on a specimen in a 2D array and in each position of the array, a 2D diffraction pattern is obtained, thus generating a 4D data set. After acquisition, by using different phase techniques such as ptychography, one can recover the transmittion function and the induced phase shift. In some applications, 4D-STEM is called STEM-CBED.
* Beam Rocking (BR)-CBED: With this technique, by rocking the incident beam with a rocking coil placed above the specimen, a virtual convergent beam is produced. Given that the diameter of the beam on the specimen is a few micrometers, this method has made CBED possible for materials that are susceptible to strong convergent beams. Furthermore, the large size of the illuminated specimen area and the low density current of the beam make specimen contamination insignificant. 
* BR-LACBED: In this technique, in addition to the rocking coil above the specimen, there is a rocking coil placed under the projector lens, which is used to bring the preferred beam to the STEM detector. Every time the incident beam is rocked, the second coil is simultaneously driven so that the beam always falls on the STEM detector.
* Signal processing and BR-CBED: In order to enhance contrast in BR-CBED, a band-pass filter can be used that filters a certain frequency band in the CBED pattern. The combination of these two techniques makes the symmetries appearing in the patterns more clear.
* CB-LEED (Low Energy Electron Diffraction): Rocking curves are analyzed at a single energy using a convergent probe. Advantages of this method are: mapping of LEED diffraction spots into CBLEED disks, the diffraction patterns originate from a localized region of the specimen which enables the extraction of localized structural information, mapping out of the surfaces, sensitivity enhancement of small atomic displacements etc. 
*Ptychography is a technique for recovering the phase of the exit electron wave. The reconstruction is done by applying an iterative phase retrieval algorithm which returns a real-space image with both phase and amplitude information. By using electron ptychography, in 2018, images of MoS with an atomic resolution of 0.39 Å were reported by Jiang et al. which set the new world record for the highest resolution microscope.
* Microdiffraction, nanodiffraction: In the literature, there are several terms used to refer to electron diffraction patterns that are acquired with a convergent beam. Such terms are CBED, microdiffraction, nanodiffraction etc. When the CBED technique is used for the acquisition of conventional diffraction information like lattice structure and interplanar spacing from very small areas, then the term microdiffraction is used. On the other hand, the term nanodiffraction is used when very small probes (< 1 nm or less in diameter) are used.