The interaction of the tip with the sample modifies the amplitudes, phase shifts and frequency resonances of the excited modes. Those changes are detected and processed by the feedback of the instrument. Several features make bimodal AFM a very powerful surface characterization method at the nanoscale. (i) Resolution. Atomic, molecular or nanoscale spatial resolution was demonstrated. (ii) Simultaneity. Maps of different properties are generated at the same time. (iii) Efficiency. A maximum number of four data points per pixel are needed to generate material property maps. (iv) Speed. Analytical solutions link observables with material properties.