The "MAXIM" (MAterials X-ray IMaging) method is another method combining diffraction analysis with spatial resolution. It can be viewed as serial topography with additional angular resolution in the exit beam. In contrast to the Rocking Curve Imaging method, it is more appropriate for more highly disturbed (polycrystalline) materials with lower crystalline perfection. The difference on the instrumental side is that MAXIM uses an array of slits / small channels (a so-called "multi-channel plate" (MCP), the two-dimensional equivalent of a Soller slit system) as an additional X-ray optical element between sample and CCD detector. These channels transmit intensity only in specific, parallel directions, and thus guarantee a one-to-one-relation between detector pixels and points on the sample surface, which would otherwise not be given in the case of materials with high strain and/or a strong mosaicity. The spatial resolution of the method is limited by a combination of detector pixel size and channel plate periodicity, which in the ideal case are identical. The angular resolution is mostly given by the aspect ratio (length over width) of the MCP channels.
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