White-beam topography uses the full bandwidth of X-ray wavelengths in the incoming beam, without any wavelength filtering (no monochromator). The technique is particularly useful in combination with synchrotron radiation sources, due to their wide and continuous wavelength spectrum. In contrast to the monochromatic case, in which accurate sample adjustment is often necessary in order to reach diffraction conditions, the Bragg equation is always and automatically fulfilled in the case of a white X-ray beam: Whatever the angle at which the beam hits a specific lattice plane, there is always one wavelength in the incident spectrum for which the Bragg angle is fulfilled just at this precise angle (on condition that the spectrum is wide enough). White-beam topography is therefore a very simple and fast technique. Disadvantages include the high X-ray dose, possibly leading to radiation damage to the sample, and the necessity to carefully shield the experiment.
White-beam topography produces a pattern of several diffraction spots, each spot being related to one specific lattice plane in the crystal. This pattern, typically recorded on X-ray film, corresponds to a Laue pattern and shows the symmetry of the crystal lattice. The fine structure of each single spot (topograph) is related to defects and distortions in the sample. The distance between spots, and the details of contrast within one single spot, depend on the distance between sample and film; this distance is therefore an important degree of freedom for white-beam topography experiments.
Deformation of the crystal will cause variation in the size of the diffraction spot. For a cylindrically bent crystal the Bragg planes in the crystal lattice will lie on Archimedean spirals (with the exception of those orientated tangentially and radially to the curvature of the bend, which are respectively cylindrical and planar), and the degree of curvature can be determined in a predictable way from the length of the spots and the geometry of the set-up.
White-beam topographs are useful for fast and comprehensive visualization of crystal defect and distortions. They are, however, rather difficult to analyze in any quantitative way, and even a qualitative interpretation often requires considerable experience and time.