The advantages of EDXRD are (1) it uses a fixed scattering angle, (2) it works directly in reciprocal space, (3) fast collection time, and (4) parallel data collection. The fixed scattering angle geometry makes EDXRD especially suitable for in situ studies in special environments (e.g. under very low or high temperatures and pressures). When the EDXRD method is used, only one entrance and one exit window are needed. The fixed scattering angle also allows for measurement of the diffraction vector directly. This allows for high-accuracy measurement of lattice parameters. It allows for rapid structure analysis and the ability to study materials that are unstable and only exist for short periods of time. Because the whole spectrum of diffracted radiation is obtained simultaneously, it enables parallel data collection studies where structural changes can be determined over time.