The setup for projection topography (also called "traverse" topography") is essentially identical to section topography, the difference being that both sample and film are now scanned laterally (synchronously) with respect to the narrow incident beam. A projection topograph therefore corresponds to the superposition of many adjacent section topographs, able to investigate not just a restricted portion, but the entire volume of a crystal.
The technique is rather simple and has been in routine use at "Lang cameras" in many research laboratories.